Inventor · disambiguated record
Aldo Losavio
Also filed as: LOSAVIO ALDO
10 granted patents·314 citations·filing 1993–2014
89Inventor score
Files withST MICROELECTRONICS SRL6CAMPARDO GIOVANNI1LOSAVIO ALDO1SGS THOMSON MICROELECTRONICS1VANALLI GIAN PIETRO1
Top patents by PatentIndex Score
10 records- 0193US8228684B2Multi chip electronic systemLOSAVIO ALDO·Filed 2008·Granted Jul 24, 2012·202 cites·22 claims
- 0274US6944072B2Self-repair method for nonvolatile memory devices with erasing/programming failure, and relative nonvolatile memory deviceST MICROELECTRONICS SRL·Filed 2003·Granted Sep 13, 2005·22 cites·41 claims
- 0374US6901011B2Self-repair method via ECC for nonvolatile memory devices, and relative nonvolatile memory deviceST MICROELECTRONICS SRL·Filed 2003·Granted May 31, 2005·19 cites·21 claims
- 0470US5598028AHighly-planar interlayer dielectric thin films in integrated circuitsST MICROELECTRONICS SRL·Filed 1995·Granted Jan 28, 1997·42 cites·16 claims
- 0558US5543633AProcess and structure for measuring the planarity degree of a dielectric layer in an integrated circuit and integrated circuit including means for performing said processSGS THOMSON MICROELECTRONICS·Filed 1993·Granted Aug 6, 1996·19 cites·16 claims
- 0652US8928123B2Through via structure including a conductive portion and aligned solder portionST MICROELECTRONICS SRL·Filed 2014·Granted Jan 6, 2015·0 cites·14 claims
- 0747US8759215B2Method for forming bumps in substrates with through viasVANALLI GIAN PIETRO·Filed 2009·Granted Jun 24, 2014·0 cites·17 claims
- 0847US6922366B2Self-repair method for nonvolatile memory devices using a supersecure architecture, and nonvolatile memory deviceST MICROELECTRONICS SRL·Filed 2003·Granted Jul 26, 2005·5 cites·31 claims
- 0934US6225231B1Recovery of damages in a field oxide caused by high energy ion implant processST MICROELECTRONICS SRL·Filed 1999·Granted May 1, 2001·5 cites·11 claims
- 1033US7616515B2Integrated electronic device having a low voltage electric supplyCAMPARDO GIOVANNI·Filed 2006·Granted Nov 10, 2009·0 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →