Inventor · disambiguated record
Alexander Roth
Also filed as: ROTH ALEXANDER · ROTH ALEXANDER JOSHUA
50 granted patents·20 pending applications·225 citations·filing 1992–2025
97Inventor score
Files withINFINEON TECHNOLOGIES AG27ROHDE & SCHWARZ24INFINEON TECHNOLOGIES AUSTRIA AG5ROTH ALEXANDER5Geotab Inc2
Top patents by PatentIndex Score
70 records- 0196US11552042B2Solder material with two different size nickel particlesINFINEON TECHNOLOGIES AG·Filed 2020·Granted Jan 10, 2023·3 cites·17 claims
- 0296US11050430B1Sampling deviceROHDE & SCHWARZ·Filed 2020·Granted Jun 29, 2021·4 cites·21 claims
- 0395US12023762B2Layer structure with an intermetallic phase layer and a chip package that includes the layer structureINFINEON TECHNOLOGIES AG·Filed 2022·Granted Jul 2, 2024·2 cites·22 claims
- 0494US10805015B1Method as well as test system for testing a device under testROHDE & SCHWARZ·Filed 2020·Granted Oct 13, 2020·8 cites·19 claims
- 0590US10586756B2Chip carrier configured for delamination-free encapsulation and stable sinteringINFINEON TECHNOLOGIES AG·Filed 2017·Granted Mar 10, 2020·6 cites·22 claims
- 0687US7913442B2Line guides for fishing rodsROTH ALEXANDER·Filed 2005·Granted Mar 29, 2011·17 cites·5 claims
- 0786US5406324ASurveillance system for transmitting images via a radio transmitterFiled 1992·Granted Apr 11, 1995·73 cites·31 claims
- 0884US12235299B2Measurement system and method of determining a corrected averaged power signalROHDE & SCHWARZ·Filed 2022·Granted Feb 25, 2025·1 cites·20 claims
- 0983US8587641B2Autostereoscopic display systemROTH ALEXANDER·Filed 2011·Granted Nov 19, 2013·7 cites·12 claims
- 1082US12330243B2Method of forming an intermetallic phase layer with a plurality of nickel particlesINFINEON TECHNOLOGIES AG·Filed 2024·Granted Jun 17, 2025·0 cites·15 claims
- 1180US11404359B2Leadframe package with isolation layerINFINEON TECHNOLOGIES AG·Filed 2020·Granted Aug 2, 2022·1 cites·28 claims
- 1277US11804383B2Method for producing a metal-ceramic substrate with electrically conductive viasINFINEON TECHNOLOGIES AG·Filed 2022·Granted Oct 31, 2023·0 cites·9 claims
- 1375US11557490B2Method for producing a metal-ceramic substrate with at least one viaINFINEON TECHNOLOGIES AG·Filed 2020·Granted Jan 17, 2023·0 cites·11 claims
- 1475US2024373548A1Pre-Plating of Solder Layer on Solderable Elements for Diffusion SolderingINFINEON TECHNOLOGIES AG·Filed 2024·Application pending·0 cites
- 1574US11137444B2Measurement device and method of setting a measurement deviceROHDE & SCHWARZ·Filed 2019·Granted Oct 5, 2021·1 cites·16 claims
- 1674US9485598B2Method and a device for measuring the amplitude noise and/or phase noise of a signalROHDE & SCHWARZ·Filed 2014·Granted Nov 1, 2016·6 cites·15 claims
- 1772US8474388B2Two-sided single-needle understitch sewing techniqueROTH ALEXANDER·Filed 2008·Granted Jul 2, 2013·1 cites·18 claims
- 1872US6662001B1Multi-heterodyne stage for a receiver or spectrum analyzerROHDE & SCHWARZ·Filed 2000·Granted Dec 9, 2003·16 cites·10 claims
- 1970US6313619B1Arrangement for measurement of phase noise of a test specimenROHDE & SCHWARZ·Filed 2000·Granted Nov 6, 2001·15 cites·4 claims
- 2068US12028117B2Method as well as test system for testing a device under testROHDE & SCHWARZ·Filed 2021·Granted Jul 2, 2024·0 cites·20 claims
- 2168US11557522B2Method for producing power semiconductor module arrangementINFINEON TECHNOLOGIES AG·Filed 2021·Granted Jan 17, 2023·0 cites·19 claims
- 2265US12069802B2Pre-plating of solder layer on solderable elements for diffusion solderingINFINEON TECHNOLOGIES AG·Filed 2020·Granted Aug 20, 2024·0 cites·7 claims
- 2364US12334989B2Radio frequency testing apparatus with voltage standing wave ratio adjustment and corresponding methodROHDE & SCHWARZ·Filed 2022·Granted Jun 17, 2025·0 cites·20 claims
- 2464US10771076B1Measuring device, calibration method and measuring method with jitter compensationROHDE & SCHWARZ·Filed 2019·Granted Sep 8, 2020·1 cites·20 claims
- 2563US6396314B1Arrangement for the warbling (sweeping) of a frequency synthesizerROHDE & SCHWARZ·Filed 2000·Granted May 28, 2002·12 cites·9 claims
- 2663US5847615AFrequency synthesizer operating according to the principle of fractional frequency synthesisROHDE & SCHWARZ·Filed 1997·Granted Dec 8, 1998·24 cites·5 claims
- 2762US2024312795A1Semiconductor module having a substrate with an insulating ceramic layer and a method for fabricating thereofINFINEON TECHNOLOGIES AUSTRIA AG·Filed 2024·Application pending·0 cites
- 2862US2022355422A1Lead-free solder material, layer structure, method of forming a solder material, and method of forming a layer structureINFINEON TECHNOLOGIES AG·Filed 2022·Application pending·0 cites
- 2961US12355502B2Measurement application device calibration unit, measurement system, methodROHDE & SCHWARZ·Filed 2023·Granted Jul 8, 2025·0 cites·15 claims
- 3061US12119284B2DBC substrate for power semiconductor devices, method for fabricating a DBC substrate and power semiconductor device having a DBC substrateINFINEON TECHNOLOGIES AUSTRIA AG·Filed 2022·Granted Oct 15, 2024·0 cites·18 claims
- 3161US10020830B2Measuring system and measuring method for measuring amplification and noise by correlationROHDE & SCHWARZ·Filed 2016·Granted Jul 10, 2018·1 cites·18 claims
- 3260US12277360B2Method and monitoring system for providing signal level performance informationROHDE & SCHWARZ·Filed 2021·Granted Apr 15, 2025·0 cites·16 claims
- 3360US2025284482A1Systems for updating peripheral device firmwareGeotab Inc·Filed 2025·Application pending·0 cites
- 3460US2025284483A1Systems for updating peripheral device firmwareGeotab Inc·Filed 2025·Application pending·0 cites
- 3559US2010189954A1Butt joint connections for core materialsEVONIK ROEHM GMBH·Filed 2008·Application pending·0 cites
- 3659US2024266237A1A semiconductor transistor package having electrical contact layers and a method for fabricating the sameINFINEON TECHNOLOGIES AUSTRIA AG·Filed 2024·Application pending·0 cites
- 3758US7023948B2Frequency converter arrangementROHDE & SCHWARZ·Filed 2002·Granted Apr 4, 2006·4 cites·6 claims
- 3858US2023352462A1Semiconductor Package Comprising a Combined Power and Logic SubstrateINFINEON TECHNOLOGIES AG·Filed 2023·Application pending·0 cites
- 3958US2023256217A1Ozone generation apparatuses and methods of treating woundsPURDUE RESEARCH FOUNDATION·Filed 2021·Application pending·0 cites
- 4057US10796929B2Method for producing a metal-ceramic substrate with at least one viaINFINEON TECHNOLOGIES AG·Filed 2017·Granted Oct 6, 2020·0 cites·10 claims
- 4156US11606154B2Wideband spectrum analyzerROHDE & SCHWARZ·Filed 2021·Granted Mar 14, 2023·0 cites·21 claims
- 4256US11081414B2Power semiconductor module arrangementINFINEON TECHNOLOGIES AG·Filed 2019·Granted Aug 3, 2021·0 cites·16 claims
- 4355US2023111301A1Device for Disinfecting HandsROTH ALEXANDER·Filed 2021·Application pending·0 cites
- 4454US12237242B2Semiconductor device package comprising a thermal interface material with improved handling propertiesINFINEON TECHNOLOGIES AUSTRIA AG·Filed 2021·Granted Feb 25, 2025·0 cites·16 claims
- 4553US2023095749A1Solder material, layer structure, chip package, method of forming a layer structure, and method of forming a chip packageINFINEON TECHNOLOGIES AG·Filed 2022·Application pending·0 cites
- 4651US11155739B2Resin-impregnated boron nitride body and a method for producing a resin-impregnated boron nitride bodyINFINEON TECHNOLOGIES AG·Filed 2017·Granted Oct 26, 2021·0 cites·20 claims
- 4751US2023369166A1Power semiconductor module arrangement and method for producing the sameINFINEON TECHNOLOGIES AUSTRIA AG·Filed 2023·Application pending·0 cites
- 4851US2024266311A1Solderable electronic device and method for fabricating the sameINFINEON TECHNOLOGIES AG·Filed 2024·Application pending·0 cites
- 4950US7747403B2Method for measuring the phase jitter of a high-frequency signal and a measuring device for the implementation of this methodROHDE & SCHWARZ·Filed 2005·Granted Jun 29, 2010·1 cites·16 claims
- 5050US2025266310A1Encapsulant with low cte and low young modulus for low-stress electronic packageINFINEON TECHNOLOGIES AG·Filed 2025·Application pending·0 cites
Showing the top 50 of 70 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →