Inventor · disambiguated record
Alan Rytlewski
Also filed as: RYTLEWSKI ALAN
1 granted patent·1 pending application·0 citations·filing 2009–2012
13Inventor score
Files withDEPESA DENNIS2
Top patents by PatentIndex Score
2 records- 0139US8895324B2Method of determining an amount of impurities that a contaminating material contributes to high purity siliconDEPESA DENNIS·Filed 2012·Granted Nov 25, 2014·0 cites·7 claims
- 0230US2011177626A1Method Of Determining An Amount of Impurities That A Contaminating Material Contributes To High Purity Silicon And Furnace For Treating High Purity SiliconDEPESA DENNIS·Filed 2009·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →