Inventor · disambiguated record
Alex See
Also filed as: SEE ALEX · SEE ALEX K H · SEE ALEX KH
32 granted patents·1 pending application·125 citations·filing 2000–2019
96Inventor score
Files withGLOBALFOUNDRIES SG PTE LTD20CHARTERED SEMICONDUCTOR MFG6LIU JINPING3POON CHYIU HYIA2LIU JIN PING1
Top patents by PatentIndex Score
33 records- 0189US9543502B2Small pitch and high density contact arrayGLOBALFOUNDRIES SG PTE LTD·Filed 2015·Granted Jan 10, 2017·7 cites·20 claims
- 0289US9511474B2CMP head structure with retaining ringGLOBALFOUNDRIES SG PTE LTD·Filed 2016·Granted Dec 6, 2016·3 cites·20 claims
- 0387US10608046B2Integrated two-terminal device with logic device for embedded applicationGLOBALFOUNDRIES SG PTE LTD·Filed 2019·Granted Mar 31, 2020·4 cites·16 claims
- 0484US10446607B2Integrated two-terminal device with logic device for embedded applicationGLOBALFOUNDRIES SG PTE LTD·Filed 2016·Granted Oct 15, 2019·4 cites·14 claims
- 0584US9520371B2Planar passivation for padsGLOBALFOUNDRIES SG PTE LTD·Filed 2014·Granted Dec 13, 2016·6 cites·20 claims
- 0684US6204137B1Method to form transistors and local interconnects using a silicon nitride dummy gate techniqueCHARTERED SEMICONDUCTOR MFG·Filed 2000·Granted Mar 20, 2001·44 cites·20 claims
- 0783US9287197B2Through silicon viasGLOBALFOUNDRIES SG PTE LTD·Filed 2013·Granted Mar 15, 2016·6 cites·20 claims
- 0881US8012839B2Method for fabricating a semiconductor device having an epitaxial channel and transistor having sameGLOBALFOUNDRIES SG PTE LTD·Filed 2008·Granted Sep 6, 2011·8 cites·7 claims
- 0981US7745320B2Method for reducing silicide defects in integrated circuitsCHARTERED SEMICONDUCTOR MFG·Filed 2008·Granted Jun 29, 2010·7 cites·21 claims
- 1080US8058123B2Integrated circuit and method of fabrication thereofLIU JINPING·Filed 2007·Granted Nov 15, 2011·8 cites·24 claims
- 1180US7892900B2Integrated circuit system employing sacrificial spacersGLOBALFOUNDRIES SG PTE LTD·Filed 2008·Granted Feb 22, 2011·9 cites·20 claims
- 1277US9209275B1Integrated circuits with memory cells and methods of manufacturing the sameGLOBALFOUNDRIES SG PTE LTD·Filed 2014·Granted Dec 8, 2015·4 cites·20 claims
- 1375US9437547B2Through silicon viasGLOBALFOUNDRIES SG PTE LTD·Filed 2016·Granted Sep 6, 2016·2 cites·20 claims
- 1473US7776699B2Strained channel transistor structure and methodCHARTERED SEMICONDUCTOR MFG·Filed 2008·Granted Aug 17, 2010·3 cites·28 claims
- 1572US9620418B2Methods for fabricating integrated circuits with improved active regionsGLOBALFOUNDRIES SG PTE LTD·Filed 2014·Granted Apr 11, 2017·3 cites·17 claims
- 1669US8324011B2Implementation of temperature-dependent phase switch layer for improved temperature uniformity during annealingPOON CHYIU HYIA·Filed 2007·Granted Dec 4, 2012·4 cites·21 claims
- 1767US8860142B2Method and apparatus to reduce thermal variations within an integrated circuit die using thermal proximity correctionGLOBALFOUNDRIES SG PTE LTD·Filed 2012·Granted Oct 14, 2014·2 cites·20 claims
- 1862US9511470B2CMP head structure with retaining ringGLOBALFOUNDRIES SG PTE LTD·Filed 2016·Granted Dec 6, 2016·0 cites·20 claims
- 1961US8546873B2Integrated circuit and method of fabrication thereofLIU JINPING·Filed 2011·Granted Oct 1, 2013·1 cites·20 claims
- 2054US10103097B2CD controlGLOBALFOUNDRIES SG PTE LTD·Filed 2014·Granted Oct 16, 2018·0 cites·20 claims
- 2148US9202746B2Integrated circuits with improved gap fill dielectric and methods for fabricating sameGLOBALFOUNDRIES SG PTE LTD·Filed 2013·Granted Dec 1, 2015·0 cites·20 claims
- 2248US8754447B2Strained channel transistor structure and methodLIU JIN PING·Filed 2010·Granted Jun 17, 2014·0 cites·25 claims
- 2348US7960283B2Method for reducing silicide defects in integrated circuitsCHARTERED SEMICONDUCTOR MFG·Filed 2010·Granted Jun 14, 2011·0 cites·20 claims
- 2448US7795680B2Integrated circuit system employing selective epitaxial growth technologyCHARTERED SEMICONDUCTOR MFG·Filed 2007·Granted Sep 14, 2010·0 cites·20 claims
- 2548US2010096695A1High stress filmCHARTERED SEMICONDUCTOR MFG·Filed 2008·Application pending·0 cites
- 2645US9548371B2Integrated circuits having nickel silicide contacts and methods for fabricating the sameGLOBALFOUNDRIES SG PTE LTD·Filed 2014·Granted Jan 17, 2017·0 cites·20 claims
- 2745US8716076B2Method for fabricating a semiconductor device having an epitaxial channel and transistor having sameLIU JINPING·Filed 2011·Granted May 6, 2014·0 cites·7 claims
- 2844US8293544B2Method and apparatus to reduce thermal variations within an integrated circuit die using thermal proximity correctionPOON DEBORA CHYIU HYIA·Filed 2008·Granted Oct 23, 2012·0 cites·16 claims
- 2943US9537092B2Integrated circuits with memory cells and methods of manufacturing the sameGLOBALFOUNDRIES SG PTE LTD·Filed 2015·Granted Jan 3, 2017·0 cites·16 claims
- 3043US8912102B2Laser annealingPOON CHYIU HYIA·Filed 2009·Granted Dec 16, 2014·0 cites·23 claims
- 3138US10115625B2Methods for removal of hard maskGLOBALFOUNDRIES SG PTE LTD·Filed 2016·Granted Oct 30, 2018·0 cites·25 claims
- 3236US10410854B2Method and device for reducing contamination for reliable bond padsGLOBALFOUNDRIES SG PTE LTD·Filed 2017·Granted Sep 10, 2019·0 cites·10 claims
- 3332US9646934B2Integrated circuits with overlay marks and methods of manufacturing the sameGLOBALFOUNDRIES SG PTE LTD·Filed 2015·Granted May 9, 2017·0 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →