Inventor · disambiguated record
Alessio Spessot
Also filed as: SPESSOT ALESSIO
19 granted patents·2 pending applications·484 citations·filing 2011–2024
93Inventor score
Top patents by PatentIndex Score
21 records- 0195US9076726B2Method for tuning the effective work function of a gate structure in a semiconductor deviceIMEC·Filed 2013·Granted Jul 7, 2015·415 cites·14 claims
- 0294US9117519B2Methods, devices and systems using over-reset state in a memory cellSPESSOT ALESSIO·Filed 2012·Granted Aug 25, 2015·23 cites·18 claims
- 0392US9613695B2Methods, devices and systems using over-reset state in a memory cellMICRON TECHNOLOGY INC·Filed 2015·Granted Apr 4, 2017·12 cites·12 claims
- 0492US9218876B2Methods, articles and devices for pulse adjustments to program a memory cellSPESSOT ALESSIO·Filed 2012·Granted Dec 22, 2015·13 cites·28 claims
- 0588US11488954B2Method of cointegrating semiconductor structures for different voltage transistorsIMEC VZW·Filed 2020·Granted Nov 1, 2022·2 cites·14 claims
- 0681US10141052B2Methods, articles, and devices for pulse adjustment to program a memory cellMICRON TECHNOLOGY INC·Filed 2017·Granted Nov 27, 2018·3 cites·17 claims
- 0777US10431302B2Methods, articles, and devices for pulse adjustment to program a memory cellMICRON TECHNOLOGY INC·Filed 2018·Granted Oct 1, 2019·2 cites·20 claims
- 0873US9711214B2Methods, articles and devices for pulse adjustments to program a memory cellMICRON TECHNOLOGY INC·Filed 2015·Granted Jul 18, 2017·2 cites·20 claims
- 0972US9245759B2Method for manufacturing a dual work function semiconductor deviceIMEC·Filed 2013·Granted Jan 26, 2016·4 cites·20 claims
- 1072US8441861B2Self-check calibration of program or erase and verify process using memory cell distributionSPESSOT ALESSIO·Filed 2011·Granted May 14, 2013·5 cites·23 claims
- 1172US2025053719A1System and method of simulating aging in device circuitsIMEC VZW·Filed 2024·Application pending·0 cites
- 1271US11251036B2Semiconductor devices and methods of manufacturing semiconductor devicesIMEC VZW·Filed 2019·Granted Feb 15, 2022·1 cites·23 claims
- 1359US12164849B2System and method of simulating aging in device circuitsIMEC VZW·Filed 2020·Granted Dec 10, 2024·0 cites·13 claims
- 1456US10803938B2Methods, articles, and devices for pulse adjustments to program a memory cellMICRON TECHNOLOGY INC·Filed 2019·Granted Oct 13, 2020·0 cites·20 claims
- 1550US8726409B2Method for driving a scanning probe microscope at elevated scan frequenciesESCH FRIEDRICH·Filed 2011·Granted May 13, 2014·2 cites·10 claims
- 1646US11374058B2Memory selector and memory device including sameIMEC VZW·Filed 2019·Granted Jun 28, 2022·0 cites·19 claims
- 1744US11276606B2Integrated electronic circuit with airgapsIMEC VZW·Filed 2019·Granted Mar 15, 2022·0 cites·13 claims
- 1843US11211404B2Memory devices based on ferroelectric field effect transistorsIMEC VZW·Filed 2019·Granted Dec 28, 2021·0 cites·13 claims
- 1940US9531371B2Restoring OFF-state stress degradation of threshold voltageIMEC VZW·Filed 2014·Granted Dec 27, 2016·0 cites·15 claims
- 2036US2019198080A1Ferroelectric memory device and method of programming sameIMEC VZW·Filed 2018·Application pending·0 cites
- 2135US10439036B2Transistor device with reduced hot carrier injection effectIMEC VZW·Filed 2016·Granted Oct 8, 2019·0 cites·22 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →