Inventor · disambiguated record
Alexander Voronov
Also filed as: VORONOV ALEXANDER
20 granted patents·4 pending applications·20 citations·filing 2007–2022
90Inventor score
Top patents by PatentIndex Score
24 records- 0184US9065054B2Method of forming organic light emitting pattern and apparatus for forming organic light emitting pattern of organic electro-luminescence display using sublimation type thermal transfer methodSAMSUNG DISPLAY CO LTD·Filed 2014·Granted Jun 23, 2015·5 cites·34 claims
- 0281US8226448B2Laser beam irradiation apparatus for substrate sealing, and method of manufacturing organic light emitting display device by using the laser beam irradiation apparatusVORONOV ALEXANDER·Filed 2010·Granted Jul 24, 2012·5 cites·29 claims
- 0376US10877243B2F-theta lens having diffractive optical element and optical system including the F-theta lensSAMSUNG DISPLAY CO LTD·Filed 2018·Granted Dec 29, 2020·2 cites·16 claims
- 0469US8835803B2Laser cutting method and method of manufacturing organic light-emitting deviceLIM WON-KYU·Filed 2010·Granted Sep 16, 2014·2 cites·15 claims
- 0568US9389197B2Barrier film defect detecting method and apparatusSAMSUNG DISPLAY CO LTD·Filed 2013·Granted Jul 12, 2016·1 cites·14 claims
- 0668US8455792B2Laser irradiation apparatus and method of manufacturing display device using the sameKIM HYUNG-SIK·Filed 2010·Granted Jun 4, 2013·2 cites·17 claims
- 0767US9464991B2Method for inspecting polysilicon layerSAMSUNG DISPLAY CO LTD·Filed 2013·Granted Oct 11, 2016·1 cites·10 claims
- 0866US11802078B2Glass and method of manufacturing the sameSAMSUNG DISPLAY CO LTD·Filed 2021·Granted Oct 31, 2023·0 cites·18 claims
- 0964US12298256B2Inspection method and inspection apparatus for performing the sameSAMSUNG DISPLAY CO LTD·Filed 2022·Granted May 13, 2025·0 cites·19 claims
- 1064US9347886B2Apparatus for monitoring deposition rate, apparatus provided with the same for depositing organic layer, method of monitoring deposition rate, and method of manufacturing organic light emitting display apparatus using the sameSAMSUNG DISPLAY CO LTD·Filed 2013·Granted May 24, 2016·1 cites·9 claims
- 1163US12415235B2Deposition mask manufacturing apparatusSAMSUNG DISPLAY CO LTD·Filed 2022·Granted Sep 16, 2025·0 cites·18 claims
- 1261US11253952B2Laser processing apparatusSAMSUNG DISPLAY CO LTD·Filed 2019·Granted Feb 22, 2022·0 cites·20 claims
- 1360US2023201962A1Laser machining deviceSAMSUNG DISPLAY CO LTD·Filed 2022·Application pending·0 cites
- 1458US9140742B2Method of measuring a silicon thin film, method of detecting defects in a silicon thin film, and silicon thin film defect detection deviceSAMSUNG DISPLAY CO LTD·Filed 2013·Granted Sep 22, 2015·1 cites·20 claims
- 1557US2022088702A1Laser devices including beam position calibrator and method for irradiating laser by using the sameSAMSUNG DISPLAY CO LTD·Filed 2021·Application pending·0 cites
- 1656US12481166B2Optical systemSAMSUNG DISPLAY CO LTD·Filed 2022·Granted Nov 25, 2025·0 cites·20 claims
- 1754US10620136B2Patterning apparatus and operating method thereofSAMSUNG DISPLAY CO LTD·Filed 2017·Granted Apr 14, 2020·0 cites·20 claims
- 1852US2022201874A1Foldable display deviceSAMSUNG DISPLAY CO LTD·Filed 2021·Application pending·0 cites
- 1947US11358240B2Deposition mask manufacturing method and manufacturing apparatus thereofSAMSUNG DISPLAY CO LTD·Filed 2018·Granted Jun 14, 2022·0 cites·9 claims
- 2046US10557756B2Shearing interferometer using two opposing shearing plates for laserSAMSUNG DISPLAY CO LTD·Filed 2018·Granted Feb 11, 2020·0 cites·8 claims
- 2145US12269115B2Laser processing apparatusSAMSUNG DISPLAY CO LTD·Filed 2019·Granted Apr 8, 2025·0 cites·20 claims
- 2242US9460930B2Method for performing laser crystallizationSAMSUNG DISPLAY CO LTD·Filed 2014·Granted Oct 4, 2016·0 cites·16 claims
- 2342US8717555B2Device and method for inspecting polycrystalline silicon layerVORONOV ALEXANDER·Filed 2011·Granted May 6, 2014·0 cites·22 claims
- 2439US2008087895A1Polysilicon thin film transistor and method of fabricating the sameHAN GYOO-WAN·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →