Inventor · disambiguated record
Ami Chand
Also filed as: CHAND AMI
14 granted patents·3 pending applications·237 citations·filing 1998–2016
92Inventor score
Top patents by PatentIndex Score
17 records- 0194US6862921B2Method and apparatus for manipulating a sampleVEECO INSTR INC·Filed 2001·Granted Mar 8, 2005·60 cites·9 claims
- 0290US7913544B1Scanning probe devices and methods for fabricating sameAPPLIED NANOSTRUCTURES INC·Filed 2007·Granted Mar 29, 2011·21 cites·15 claims
- 0385US7040147B2Method and apparatus for manipulating a sampleVEECO INSTR INC·Filed 2005·Granted May 9, 2006·8 cites·30 claims
- 0482US6016693AMicrofabrication of cantilevers using sacrificial templatesUNIV CALIFORNIA·Filed 1998·Granted Jan 25, 2000·118 cites·20 claims
- 0576US8397555B1Scanning probe devicesCHAND AMI·Filed 2011·Granted Mar 19, 2013·4 cites·23 claims
- 0674US7334460B2Method and apparatus of manipulating a sampleVEECO INSTR INC·Filed 2006·Granted Feb 26, 2008·4 cites·16 claims
- 0774US7210330B2Methods of fabricating structures for characterizing tip shape of scanning probe microscope probes and structures fabricated therebyVEECO INSTR INC·Filed 2006·Granted May 1, 2007·5 cites·10 claims
- 0869US9389244B2Vertical embedded sensor and process of manufacturing thereofAPPLIED NANOSTRUCTURES INC·Filed 2014·Granted Jul 12, 2016·3 cites·20 claims
- 0962US8857247B2Probe for a scanning probe microscope and method of manufactureKJOLLER KEVIN J·Filed 2008·Granted Oct 14, 2014·2 cites·12 claims
- 1051US7370515B2Probes for use in scanning probe microscopes and methods of fabricating such probesVEECO INSTR INC·Filed 2004·Granted May 13, 2008·7 cites·26 claims
- 1149US7096711B2Methods of fabricating structures for characterizing tip shape of scanning probe microscope probes and structures fabricated therebyVEECO INSTR INC·Filed 2004·Granted Aug 29, 2006·5 cites·15 claims
- 1248US8003534B2Method of forming semiconductor devices in wafer assemblyAPPLIED NANOSTRUCTURES INC·Filed 2010·Granted Aug 23, 2011·0 cites·17 claims
- 1348US7884445B2Semiconductor device in wafer assemblyAPPLIED NANOSTRUCTURES INC·Filed 2006·Granted Feb 8, 2011·0 cites·30 claims
- 1441US2006213289A1Probe for a scanning probe microscope and method of manufactureKJOLLER KEVIN J·Filed 2005·Application pending·0 cites
- 1541US2008011058A1Piezoresistive cantilever based nanoflow and viscosity sensor for microchannelsUNIV CALIFORNIA·Filed 2007·Application pending·0 cites
- 1631US2017184631A1Probe device for scanning probe microscopes and method of manufacture thereofAPPLIED NANOSTRUCTURES INC·Filed 2016·Application pending·0 cites
- 1728US8828243B2Scanning probe having integrated silicon tip with cantileverPODDAR RAKESH·Filed 2010·Granted Sep 9, 2014·0 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →