Inventor · disambiguated record
Amitava Chatterjee
Also filed as: CHATTERJEE AMITAVA
104 granted patents·6 pending applications·2,164 citations·filing 1988–2022
99Inventor score
Files withTEXAS INSTRUMENTS INC98CHATTERJEE AMITAVA2BENAISSA KAMEL1BORDELON JR TERRY JAMES1HOUSTON THEODORE W1
Top patents by PatentIndex Score
110 records- 0196US8067279B2Application of different isolation schemes for logic and embedded memorySADRA KAYVAN·Filed 2009·Granted Nov 29, 2011·113 cites·5 claims
- 0295US5465189ALow voltage triggering semiconductor controlled rectifiersTEXAS INSTRUMENTS INC·Filed 1994·Granted Nov 7, 1995·169 cites·37 claims
- 0394US9583596B2Drain extended CMOS with counter-doped drain extensionTEXAS INSTRUMENTS INC·Filed 2015·Granted Feb 28, 2017·8 cites·11 claims
- 0493US5225702ASilicon controlled rectifier structure for electrostatic discharge protectionTEXAS INSTRUMENTS INC·Filed 1991·Granted Jul 6, 1993·87 cites·30 claims
- 0592US4896243AEfficient ESD input protection schemeTEXAS INSTRUMENTS INC·Filed 1988·Granted Jan 23, 1990·73 cites·12 claims
- 0691US6081002ALateral SCR structure for ESD protection in trench isolated technologiesTEXAS INSTRUMENTS INC·Filed 1998·Granted Jun 27, 2000·96 cites·19 claims
- 0790US5453384AMethod of making a silicon controlled rectifier device for electrostatic discharge protectionTEXAS INSTRUMENTS INC·Filed 1994·Granted Sep 26, 1995·66 cites·30 claims
- 0889US7098099B1Semiconductor device having optimized shallow junction geometries and method for fabrication thereofTEXAS INSTRUMENTS INC·Filed 2005·Granted Aug 29, 2006·20 cites·18 claims
- 0988US8592900B2Drain extended CMOS with counter-doped drain extensionSTEINMANN PHILIPP·Filed 2011·Granted Nov 26, 2013·8 cites·8 claims
- 1088US7039888B2Modeling process for integrated circuit film resistorsTEXAS INSTRUMENTS INC·Filed 2003·Granted May 2, 2006·52 cites·14 claims
- 1188US6682980B2Fabrication of abrupt ultra-shallow junctions using angled PAI and fluorine implantTEXAS INSTRUMENTS INC·Filed 2002·Granted Jan 27, 2004·48 cites·29 claims
- 1288US6649983B2Vertical bipolar transistor formed using CMOS processesTEXAS INSTRUMENTS INC·Filed 2001·Granted Nov 18, 2003·46 cites·27 claims
- 1388US6482724B1Integrated circuit asymmetric transistorsTEXAS INSTRUMENTS INC·Filed 2000·Granted Nov 19, 2002·42 cites·22 claims
- 1488US5019878AProgrammable interconnect or cell using silicided MOS transistorsTEXAS INSTRUMENTS INC·Filed 1989·Granted May 28, 1991·66 cites·10 claims
- 1587US9099523B2ESD protection circuit with isolated SCR for negative voltage operationTEXAS INSTRUMENTS INC·Filed 2012·Granted Aug 4, 2015·6 cites·8 claims
- 1687US6015992ABistable SCR-like switch for ESD protection of silicon-on-insulator integrated circuitsTEXAS INSTRUMENTS INC·Filed 1997·Granted Jan 18, 2000·77 cites·9 claims
- 1787US5907462AGate coupled SCR for ESD protection circuitsTEXAS INSTRUMENTS INC·Filed 1994·Granted May 25, 1999·68 cites·20 claims
- 1886US6180978B1Disposable gate/replacement gate MOSFETs for sub-0.1 micron gate length and ultra-shallow junctionsTEXAS INSTRUMENTS INC·Filed 1998·Granted Jan 30, 2001·76 cites·8 claims
- 1986US5917219ASemiconductor devices with pocket implant and counter dopingTEXAS INSTRUMENTS INC·Filed 1996·Granted Jun 29, 1999·58 cites·9 claims
- 2085US6514810B1Buried channel PMOS transistor in dual gate CMOS with reduced masking stepsTEXAS INSTRUMENTS INC·Filed 2001·Granted Feb 4, 2003·37 cites·7 claims
- 2184US6639284B1Compensated-well electrostatic discharge protection structureTEXAS INSTRUMENTS INC·Filed 2002·Granted Oct 28, 2003·29 cites·21 claims
- 2284US6117741AMethod of forming a transistor having an improved sidewall gate structureTEXAS INSTRUMENTS INC·Filed 1999·Granted Sep 12, 2000·83 cites·16 claims
- 2382US7229869B2Method for manufacturing a semiconductor device using a sidewall spacer etchbackTEXAS INSTRUMENTS INC·Filed 2005·Granted Jun 12, 2007·11 cites·30 claims
- 2482US7193277B2Application of different isolation schemes for logic and embedded memoryTEXAS INSTRUMENTS INC·Filed 2005·Granted Mar 20, 2007·7 cites·3 claims
- 2582US6125021ASemiconductor ESD protection circuitTEXAS INSTRUMENTS INC·Filed 1997·Granted Sep 26, 2000·52 cites·16 claims
- 2681US7859289B2Method for measuring interface traps in thin gate oxide MOSFETSTEXAS INSTRUMENTS INC·Filed 2010·Granted Dec 28, 2010·4 cites·14 claims
- 2781US6313010B1Integrated circuit insulator and methodTEXAS INSTRUMENTS INC·Filed 1997·Granted Nov 6, 2001·62 cites·4 claims
- 2879US8779550B2Analog floating-gate capacitor with improved data retention in a silicided integrated circuitLIU KAIPING·Filed 2012·Granted Jul 15, 2014·6 cites·8 claims
- 2979US7514331B2Method of manufacturing gate sidewalls that avoids recessingTEXAS INSTRUMENTS INC·Filed 2006·Granted Apr 7, 2009·6 cites·19 claims
- 3079US6730555B2Transistors having selectively doped channel regionsTEXAS INSTRUMENTS INC·Filed 2002·Granted May 4, 2004·25 cites·17 claims
- 3179US6303420B1Integrated bipolar junction transistor for mixed signal circuitsTEXAS INSTRUMENTS INC·Filed 2000·Granted Oct 16, 2001·25 cites·16 claims
- 3278US12057443B2ESD protection circuit with isolated SCR for negative voltage operationTEXAS INSTRUMENTS INC·Filed 2022·Granted Aug 6, 2024·0 cites·17 claims
- 3378US10128145B2Diffusion resistor with reduced voltage coefficient of resistance and increased breakdown voltage using CMOS wellsTEXAS INSTRUMENTS INC·Filed 2014·Granted Nov 13, 2018·4 cites·17 claims
- 3478US8753944B2Pocket counterdoping for gate-edge diode leakage reductionTEXAS INSTRUMENTS INC·Filed 2013·Granted Jun 17, 2014·4 cites·20 claims
- 3578US5909628AReducing non-uniformity in a refill layer thickness for a semiconductor deviceTEXAS INSTRUMENTS INC·Filed 1997·Granted Jun 1, 1999·54 cites·31 claims
- 3678US5517051ASilicon controlled rectifier structure for electrostatic discharge protectionTEXAS INSTURMENTS INC·Filed 1995·Granted May 14, 1996·33 cites·1 claims
- 3777US6479339B2Use of a thin nitride spacer in a split gate embedded analog processTEXAS INSTRUMENTS INC·Filed 2001·Granted Nov 12, 2002·20 cites·18 claims
- 3877US6297125B1Air-bridge integration scheme for reducing interconnect delayTEXAS INSTRUMENTS INC·Filed 1999·Granted Oct 2, 2001·52 cites·9 claims
- 3975US7314800B2Application of different isolation schemes for logic and embedded memoryTEXAS INSTRUMENTS INC·Filed 2005·Granted Jan 1, 2008·4 cites·4 claims
- 4075US6413824B1Method to partially or completely suppress pocket implant in selective circuit elements with no additional mask in a cmos flow where separate masking steps are used for the drain extension implants for the low voltage and high voltage transistorsTEXAS INSTRUMENTS INC·Filed 2000·Granted Jul 2, 2002·21 cites·17 claims
- 4175US6127232ADisposable gate/replacement gate MOSFETS for sub-0.1 micron gate length and ultra-shallow junctionsTEXAS INSTRUMENTS INC·Filed 1999·Granted Oct 3, 2000·40 cites·3 claims
- 4274US9865507B2Low-cost CMOS structure with dual gate dielectrics and method of forming the CMOS structureTEXAS INSTRUMENTS INC·Filed 2016·Granted Jan 9, 2018·1 cites·11 claims
- 4374US9202912B2Low cost demos transistor with improved CHC immunityTEXAS INSTRUMENTS INC·Filed 2014·Granted Dec 1, 2015·2 cites·17 claims
- 4474US7638402B2Sidewall spacer pullback schemeTEXAS INSTRUMENTS INC·Filed 2007·Granted Dec 29, 2009·6 cites·18 claims
- 4573US10608110B2I-shaped gate electrode for improved sub-threshold MOSFET performanceTEXAS INSTRUMENTS INC·Filed 2017·Granted Mar 31, 2020·1 cites·12 claims
- 4673US9231054B2Drain extended CMOS with counter-doped drain extensionTEXAS INSTRUMENTS INC·Filed 2013·Granted Jan 5, 2016·2 cites·10 claims
- 4773US8716827B2Diffusion resistor with reduced voltage coefficient of resistance and increased breakdown voltage using CMOS wellsBENAISSA KAMEL·Filed 2012·Granted May 6, 2014·3 cites·10 claims
- 4873US6306725B1In-situ liner for isolation trench side walls and methodTEXAS INSTRUMENTS INC·Filed 2000·Granted Oct 23, 2001·19 cites·5 claims
- 4971US8053322B2Epitaxial deposition-based processes for reducing gate dielectric thinning at trench edges and integrated circuits therefromTEXAS INSTRUMENTS INC·Filed 2008·Granted Nov 8, 2011·5 cites·21 claims
- 5071US6869840B2Compensated-well electrostatic discharge protection devicesTEXAS INSTRUMENTS INC·Filed 2003·Granted Mar 22, 2005·14 cites·20 claims
Showing the top 50 of 110 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →