Inventor · disambiguated record
Amjad T. Obeidat
Also filed as: OBEIDAT AMJAD · OBEIDAT AMJAD T · OBEIDAT AMJAD TURKI
9 granted patents·2 pending applications·153 citations·filing 1999–2025
89Inventor score
Top patents by PatentIndex Score
11 records- 0192US9652091B1Touch sensitive display utilizing mutual capacitance and self capacitanceAMAZON TECH INC·Filed 2013·Granted May 16, 2017·28 cites·29 claims
- 0279US7555091B1System and method for providing a clock and data recovery circuit with a self test capabilityNAT SEMICONDUCTOR CORP·Filed 2004·Granted Jun 30, 2009·26 cites·18 claims
- 0374US7668272B1Method and apparatus for data transfer between mesochronous clock domainsNAT SEMICONDUCTOR CORP·Filed 2004·Granted Feb 23, 2010·23 cites·20 claims
- 0474US7571360B1System and method for providing a clock and data recovery circuit with a fast bit error rate self test capabilityNAT SEMICONDUCTOR CORP·Filed 2004·Granted Aug 4, 2009·20 cites·20 claims
- 0571US7406101B1System and method for providing on-chip delay measurements in serializer / deserializer systemsNAT SEMICONDUCTOR CORP·Filed 2004·Granted Jul 29, 2008·16 cites·31 claims
- 0662US7233173B1System and method for providing a low jitter data receiver for serial links with a regulated single ended phase interpolatorNAT SEMICONDUCTOR CORP·Filed 2004·Granted Jun 19, 2007·12 cites·22 claims
- 0761US6242348B1Method for the formation of a boron-doped silicon gate layer underlying a cobalt silicide layerNAT SEMICONDUCTOR CORP·Filed 1999·Granted Jun 5, 2001·27 cites·10 claims
- 0859US2025209880A1Smart home short-term rental systemAIRBNB INC·Filed 2025·Application pending·0 cites
- 0957US7809026B1System and method for providing on-chip delay measurements in serializer/deserializer systemsNAT SEMICONDUCTOR CORP·Filed 2008·Granted Oct 5, 2010·1 cites·20 claims
- 1056US12277825B2Smart home short-term rental systemAIRBNB INC·Filed 2023·Granted Apr 15, 2025·0 cites·20 claims
- 1143US2013265276A1Multiple touch sensing modesOBEIDAT AMJAD T·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →