Inventor · disambiguated record
Amir Roggel
Also filed as: ROGGEL AMIR
4 granted patents·248 citations·filing 1997–2000
81Inventor score
Files withINTEL CORP4
Top patents by PatentIndex Score
4 records- 0193US6162652AProcess for sort testing C4 bumped wafersINTEL CORP·Filed 1997·Granted Dec 19, 2000·177 cites·16 claims
- 0276US6515358B1Integrated passivation process, probe geometry and probing processINTEL CORP·Filed 2000·Granted Feb 4, 2003·34 cites·17 claims
- 0355US6759858B2Integrated circuit test probe having ridge contactINTEL CORP·Filed 1999·Granted Jul 6, 2004·19 cites·20 claims
- 0455US6143668AKLXX technology with integrated passivation process, probe geometry and probing processINTEL CORP·Filed 1997·Granted Nov 7, 2000·18 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →