Inventor · disambiguated record
Andrew Bowdler
Also filed as: BOWDLER ANDREW · BOWDLER ANDREW R
10 granted patents·1 pending application·86 citations·filing 2001–2022
88Inventor score
Technology areasH01J
Top patents by PatentIndex Score
11 records- 0186US6888129B2Ion optics system for TOF mass spectrometerKRATOS ANALYTICAL LTD·Filed 2001·Granted May 3, 2005·25 cites·22 claims
- 0283US8198582B2Method and apparatus for thermalization of ionsRAPTAKIS EMMANUEL·Filed 2007·Granted Jun 12, 2012·9 cites·36 claims
- 0383US6717134B2Calibration methodKRATOS ANALYTICAL LTD·Filed 2001·Granted Apr 6, 2004·21 cites·25 claims
- 0477US7071463B2Calibration methodKRATOS ANALYTICAL LTD·Filed 2003·Granted Jul 4, 2006·13 cites·11 claims
- 0571US8212209B2TOF mass spectrometer for stigmatic imaging and associated methodBOWDLER ANDREW·Filed 2009·Granted Jul 3, 2012·3 cites·19 claims
- 0670US8791408B2Methods and apparatuses for producing mass spectrum dataBOWDLER ANDREW·Filed 2011·Granted Jul 29, 2014·3 cites·18 claims
- 0770US7910878B2Method and apparatus for ion axial spatial distribution focusingKRATOS ANALYTICAL LTD·Filed 2009·Granted Mar 22, 2011·2 cites·32 claims
- 0868US7041970B2Ion optics system for TOF mass spectrometerKRATES ANALYTICAL LTD·Filed 2004·Granted May 9, 2006·9 cites·45 claims
- 0960US7579586B2Ion selectorKRATOS ANALYTICAL LTD·Filed 2005·Granted Aug 25, 2009·1 cites·34 claims
- 1053US2024213013A1Time of flight mass spectrometerKRATOS ANALYTICAL LTD·Filed 2022·Application pending·0 cites
- 1144US12183564B2Mass spectrometry apparatusKRATOS ANALYTICAL LTD·Filed 2020·Granted Dec 31, 2024·0 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →