Inventor · disambiguated record
Andrey Danilov
Also filed as: DANILOV ANDREY
8 granted patents·6 pending applications·53 citations·filing 2004–2023
81Inventor score
Top patents by PatentIndex Score
14 records- 0191US7654159B2MEMS nanoindenterNANOFACTORY INSTRUMENTS AB·Filed 2005·Granted Feb 2, 2010·44 cites·13 claims
- 0264US11624728B2Method for determining the geometry of a defect and for determining a load limitROSEN SWISS AG·Filed 2018·Granted Apr 11, 2023·2 cites·20 claims
- 0361US2023258599A1Method for determining the geometry of a defect and for determining a load limitROSEN SWISS AG·Filed 2023·Application pending·0 cites
- 0456US10315237B2Pig, in particular inspection or cleaning pigROSEN SWISS AG·Filed 2014·Granted Jun 11, 2019·2 cites·20 claims
- 0551US7363802B2Measurement device for electron microscopeNANOFACTORY INSTRUMENTS AB·Filed 2004·Granted Apr 29, 2008·2 cites·17 claims
- 0649US2024240968A1Odometer and inspection and/or cleaning deviceROSEN IP AG·Filed 2022·Application pending·0 cites
- 0749US2025351744A1Method and system for optimising the operating temperature of superconducting quantum processorsNPL MANAGEMENT LTD·Filed 2023·Application pending·0 cites
- 0845US12140567B2Method for determining the geometry of an object based on data from non-destructive measuring methodsROSEN SWISS AG·Filed 2020·Granted Nov 12, 2024·0 cites·15 claims
- 0942US12359913B2Method for determining the geometry of a defect and for determining a load limitROSEN SWISS AG·Filed 2020·Granted Jul 15, 2025·0 cites·21 claims
- 1041US2023091681A1Method for determining the geometry of a defect based on non-destructive measurement methods using direct inversionROSEN SWISS AG·Filed 2020·Application pending·0 cites
- 1140US2024230515A1Method and inspection device for examining the cathodic protection of a, more particularly ferromagnetic, pipelineROSEN IP AG·Filed 2022·Application pending·0 cites
- 1238US12331869B2Inspection device and inspection unitROSEN SWISS AG·Filed 2021·Granted Jun 17, 2025·0 cites·18 claims
- 1332US6924489B2Device for reducing the impact of distortions in a microscopeNANOFACTORY INSTRUMENTS AB·Filed 2004·Granted Aug 2, 2005·3 cites·11 claims
- 1427US2012138792A1Optical probing in electron microscopesDANILOV ANDREY·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →