Inventor · disambiguated record
Andries Pieter Johan Effting
Also filed as: EFFTING ANDRIES PIETER JOHAN
3 granted patents·1 pending application·0 citations·filing 2020–2021
38Inventor score
Files withDELMIC IP B V4
Top patents by PatentIndex Score
4 records- 0146US12306121B2Method and apparatus for inspecting a sample by means of multiple charged particle beamletsDELMIC IP B V·Filed 2021·Granted May 20, 2025·0 cites·11 claims
- 0243US2023298855A1Method and apparatus for micromachining a sample using a focused ion beamDELMIC IP B V·Filed 2021·Application pending·0 cites
- 0336US12123841B2Apparatus and method for projecting an array of multiple charged particle beamlets on a sampleDELMIC IP B V·Filed 2021·Granted Oct 22, 2024·0 cites·11 claims
- 0430US12387905B2Apparatus and method for detecting one or more scanning charged particle beamsDELMIC IP B V·Filed 2020·Granted Aug 12, 2025·0 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →