Inventor · disambiguated record
Andrew Norman Erickson
Also filed as: ERICKSON ANDREW N · ERICKSON ANDREW NORMAN
14 granted patents·4 pending applications·89 citations·filing 1995–2020
91Inventor score
Files withMULTIPROBE INC6ANGSTROM SCIENCE INC3ADVANCED MICRO DEVICES INC2DCG SYSTEMS INC2ERICKSON ANDREW N2
Top patents by PatentIndex Score
18 records- 0184US10260914B1Fiber optic displacement sensorANGSTROM SCIENCE INC·Filed 2018·Granted Apr 16, 2019·6 cites·4 claims
- 0272US9797922B2Scanning probe microscope head designANGSTROM SCIENCE INC·Filed 2016·Granted Oct 24, 2017·1 cites·8 claims
- 0371US9366695B2Scanning probe microscope head designANGSTROM SCIENCE INC·Filed 2015·Granted Jun 14, 2016·2 cites·17 claims
- 0469US9869696B2Method for imaging a feature using a scanning probe microscopeDCG SYSTEMS INC·Filed 2016·Granted Jan 16, 2018·1 cites·22 claims
- 0569US9551743B2Apparatus and method for combined micro-scale and nano-scale C-V, Q-V, and I-V testing of semiconductor materialsERICKSON ANDREW N·Filed 2012·Granted Jan 24, 2017·2 cites·14 claims
- 0669US8800998B2Semiconductor wafer isolated transfer chuckERICKSON ANDREW N·Filed 2011·Granted Aug 12, 2014·4 cites·8 claims
- 0769US7415868B2Deconvolving tip artifacts using multiple scanning probesMULTIPROBE INC·Filed 2006·Granted Aug 26, 2008·5 cites·16 claims
- 0864US6880389B2Software synchronization of multiple scanning probesMULTIPROBE INC·Filed 2003·Granted Apr 19, 2005·11 cites·15 claims
- 0964US6287880B1Method and apparatus for high resolution profiling in semiconductor structuresVEECO INSTR INC·Filed 2000·Granted Sep 11, 2001·12 cites·29 claims
- 1055US6951130B2Software synchronization of multiple scanning probesMULTIPROBE INC·Filed 2004·Granted Oct 4, 2005·7 cites·11 claims
- 1154US10816571B1Scanned probe mounting designERICKSON ANDREW NORMAN·Filed 2019·Granted Oct 27, 2020·0 cites·12 claims
- 1250US5713667ATemperature sensing probe for microthermometryADVANCED MICRO DEVICES INC·Filed 1995·Granted Feb 3, 1998·21 cites·12 claims
- 1349US5710052AScanning spreading resistance probeADVANCED MICRO DEVICES INC·Filed 1995·Granted Jan 20, 1998·15 cites·7 claims
- 1447US7444857B2Software synchronization of multiple scanning probesMULTIPROBE INC·Filed 2005·Granted Nov 4, 2008·2 cites·15 claims
- 1542US2010148813A1Apparatus and method for combined micro-scale and nano-scale c-v, q-v, and i-v testing of semiconductor materialsMULTIPROBE INC·Filed 2007·Application pending·0 cites
- 1633US2020240576A1Orthogonal two axis kinematic translation stageERICKSON ANDREW NORMAN·Filed 2020·Application pending·0 cites
- 1731US2017003336A1Diamond delayering for electrical probingDCG SYSTEMS INC·Filed 2016·Application pending·0 cites
- 1827US2015338627A1Apparatus and method for atomic force, near-field scanning optical microscopyMULTIPROBE INC·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →