Inventor · disambiguated record
Andrew J. Krivy
Also filed as: KRIVY ANDREW · KRIVY ANDREW J
14 granted patents·779 citations·filing 1997–2005
95Inventor score
Files withMICRON TECHNOLOGY INC14
Top patents by PatentIndex Score
14 records- 0199US6359456B1Probe card and test system for semiconductor wafersMICRON TECHNOLOGY INC·Filed 2001·Granted Mar 19, 2002·149 cites·25 claims
- 0299US6060891AProbe card for semiconductor wafers and method and system for testing wafersMICRON TECHNOLOGY INC·Filed 1997·Granted May 9, 2000·218 cites·21 claims
- 0396US6275052B1Probe card and testing method for semiconductor wafersMICRON TECHNOLOGY INC·Filed 1999·Granted Aug 14, 2001·118 cites·25 claims
- 0495US6420892B1Calibration target for calibrating semiconductor wafer test systemsMICRON TECHNOLOGY INC·Filed 2000·Granted Jul 16, 2002·62 cites·16 claims
- 0594US6239590B1Calibration target for calibrating semiconductor wafer test systemsMICRON TECHNOLOGY INC·Filed 1998·Granted May 29, 2001·70 cites·28 claims
- 0691US6798224B1Method for testing semiconductor wafersMICRON TECHNOLOGY INC·Filed 2002·Granted Sep 28, 2004·42 cites·12 claims
- 0787US6019663ASystem for cleaning semiconductor device probeMICRON TECHNOLOGY INC·Filed 1998·Granted Feb 1, 2000·59 cites·40 claims
- 0883US6257958B1Method for cleaning semiconductor device probeMICRON TECHNOLOGY INC·Filed 2000·Granted Jul 10, 2001·23 cites·21 claims
- 0958US7250780B2Probe card for semiconductor wafers having mounting plate and socketMICRON TECHNOLOGY INC·Filed 2003·Granted Jul 31, 2007·6 cites·26 claims
- 1058US6254469B1Wafer for cleaning semiconductor device probeMICRON TECHNOLOGY INC·Filed 2000·Granted Jul 3, 2001·6 cites·20 claims
- 1149US7268574B2Systems and methods for sensing obstructions associated with electrical testing of microfeature workpiecesMICRON TECHNOLOGY INC·Filed 2005·Granted Sep 11, 2007·1 cites·54 claims
- 1249US6419844B1Method for fabricating calibration target for calibrating semiconductor wafer test systemsMICRON TECHNOLOGY INC·Filed 1999·Granted Jul 16, 2002·10 cites·20 claims
- 1348US6023172ALight-based method and apparatus for maintaining probe cardsMICRON TECHNOLOGY INC·Filed 1997·Granted Feb 8, 2000·13 cites·29 claims
- 1447US6623345B2Wafer for cleaning semiconductor device probeMICRON TECHNOLOGY INC·Filed 2001·Granted Sep 23, 2003·2 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →