Inventor · disambiguated record
Andrew J. Lepage
Also filed as: LEPAGE ANDREW J
3 granted patents·121 citations·filing 1989–1992
76Inventor score
Technology areasG01R
Top patents by PatentIndex Score
3 records- 0178US4970461AMethod and apparatus for non-contact opens/shorts testing of electrical circuitsLEPAGE ANDREW J·Filed 1989·Granted Nov 13, 1990·47 cites·14 claims
- 0276US5202623ALaser-activated plasma chamber for non-contact testingDIGITAL EQUIPMENT CORP·Filed 1992·Granted Apr 13, 1993·45 cites·16 claims
- 0369US5032788ATest cell for non-contact opens/shorts testing of electrical circuitsDIGITAL EQUIPMENT CORP·Filed 1989·Granted Jul 16, 1991·29 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →