Inventor · disambiguated record
Andreas Mecke
Also filed as: MECKE ANDREAS
1 granted patent·1 pending application·4 citations·filing 2014–2024
24Inventor score
Technology areasG01N
Top patents by PatentIndex Score
2 records- 0170US10209204B2X-ray inspection system and method for rotating a test object by means of such an X-ray inspection systemYXLON INT GMBH·Filed 2014·Granted Feb 19, 2019·4 cites·10 claims
- 0247US2025155385A1Object Manipulator for an X-ray Inspection SystemCOMET YXLON GMBH·Filed 2024·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →