Inventor · disambiguated record
Anton Sergeevich Medvedev
Also filed as: MEDVEDEV ANTON · MEDVEDEV Anton Sergeevich
9 granted patents·2 pending applications·24 citations·filing 2015–2024
82Inventor score
Files withSAMSUNG ELECTRONICS CO LTD11
Top patents by PatentIndex Score
11 records- 0187US11045103B2Physiological parameter detecting apparatus and method of detecting physiological parametersSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Jun 29, 2021·10 cites·15 claims
- 0286US10224688B2Optical dual-comb source apparatuses including optical microresonatorSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Mar 5, 2019·7 cites·25 claims
- 0385US9995648B2Optical measurement system and method for measuring critical dimension of nanostructureSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Jun 12, 2018·5 cites·17 claims
- 0477US11823961B2Substrate inspection system and method of manufacturing semiconductor device using substrate inspection systemSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Nov 21, 2023·1 cites·20 claims
- 0575US10816480B2Method of detecting a defect on a substrate, apparatus for performing the same and method of manufacturing semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Oct 27, 2020·1 cites·19 claims
- 0660US11969238B2Physiological parameter detecting apparatus and method of detecting physiological parametersSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Apr 30, 2024·0 cites·9 claims
- 0754US2025025072A1Device and method for measuring blood constituentsSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0849US11470287B2Color imaging apparatus using monochrome sensors for mobile devicesSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Oct 11, 2022·0 cites·20 claims
- 0948US2022120662A1Particle inspection device based on spatial modulation method and particle inspection method using the particle inspection deviceSAMSUNG ELECTRONICS CO LTD·Filed 2021·Application pending·0 cites
- 1045US10296776B2Device and method for biometrics authenticationSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted May 21, 2019·0 cites·15 claims
- 1140US11922606B2Multipass interference correction and material recognition based on patterned illumination without frame rate lossSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Mar 5, 2024·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →