Inventor · disambiguated record
Ankita Patidar
Also filed as: PATIDAR ANKITA
17 granted patents·5 pending applications·18 citations·filing 2018–2025
90Inventor score
Files withTAIWAN SEMICONDUCTOR MFG CO LTD22
Top patents by PatentIndex Score
22 records- 0194US11727177B2Integrated circuit design method, system and computer program productTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Aug 15, 2023·2 cites·20 claims
- 0294US11379643B2Integrated circuit design method, system and computer program productTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Jul 5, 2022·3 cites·20 claims
- 0392US11699010B2Method and system for reducing migration errorsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Jul 11, 2023·2 cites·20 claims
- 0492US11055455B1Method and system for reducing migration errorsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Jul 6, 2021·3 cites·20 claims
- 0588US2025327854A1Method of testing an integrated circuit and testing systemTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 0685US11837308B2Systems and methods to detect cell-internal defectsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Dec 5, 2023·1 cites·20 claims
- 0784US11663387B2Fault diagnosticsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted May 30, 2023·1 cites·20 claims
- 0881US12399211B2Method of testing an integrated circuit and testing systemTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Aug 26, 2025·0 cites·20 claims
- 0978US11295831B2Systems and methods to detect cell-internal defectsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Apr 5, 2022·1 cites·20 claims
- 1078US10685157B2Power-aware scan partitioningTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Jun 16, 2020·1 cites·17 claims
- 1178US2025377688A1Circuit and methodology for power profileTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 1277US12314644B2Integrated circuit design method, system and computer program productTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted May 27, 2025·0 cites·20 claims
- 1377US12229483B2Method and system for reducing migration errorsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Feb 18, 2025·0 cites·20 claims
- 1474US11068633B2Fault diagnosticsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Jul 20, 2021·2 cites·20 claims
- 1573US12346147B2Circuit and methodology for power profileTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Jul 1, 2025·0 cites·20 claims
- 1672US2023385498A1Fault diagnosticsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Application pending·0 cites
- 1770US2024087668A1Systems and methods to detect cell-internal defectsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Application pending·0 cites
- 1869US11386253B2Power-aware scan partitioningTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Jul 12, 2022·0 cites·20 claims
- 1965US11113444B2Machine-learning based scan design enablement platformTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Sep 7, 2021·1 cites·19 claims
- 2062US11879933B2Method of testing an integrated circuit and testing systemTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Jan 23, 2024·0 cites·20 claims
- 2160US10871518B2Systems and methods for determining systematic defectsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Dec 22, 2020·1 cites·20 claims
- 2257US2025190663A1Method and system for reducing migration errorsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →