Inventor · disambiguated record
Andreas Schellinger
Also filed as: SCHELLINGER ANDREAS
1 granted patent·2 pending applications·10 citations·filing 2002–2004
32Inventor score
Files withINFINEON TECHNOLOGIES AG1
Top patents by PatentIndex Score
3 records- 0150US6677745B2Test apparatus for parallel testing a number of electronic components and a method for calibrating the test apparatusINFINEON TECHNOLOGIES AG·Filed 2002·Granted Jan 13, 2004·10 cites·7 claims
- 0220US2005028062A1Test method and apparatus for high-speed semiconductor memory devicesFiled 2004·Application pending·0 cites
- 0320US2005033949A1Test method, test receptacle and test arrangement for high-speed semiconductor memory devicesFiled 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →