Inventor · disambiguated record
Annie Tissier
Also filed as: TISSIER ANNIE
8 granted patents·41 citations·filing 1987–2003
84Inventor score
Files withFRANCE TELECOM CNET2ST MICROELECTRONICS INC2FRANCE ETAT1FRANCE TELECOM1FRENCH STATE MINISTER OF POST1
Top patents by PatentIndex Score
8 records- 0156US6707134B1Semiconductor structure having an improved pre-metal dielectric stack and method for forming the sameST MICROELECTRONICS INC·Filed 2000·Granted Mar 16, 2004·7 cites·16 claims
- 0243US5437948AProcess for adjusting a photolithographic exposure machine and associated deviceFRANCE TELECOM·Filed 1993·Granted Aug 1, 1995·10 cites·9 claims
- 0342US6861352B2Semiconductor structure having an improved pre-metal dielectric stack and method for forming the sameST MICROELECTRONICS INC·Filed 2003·Granted Mar 1, 2005·1 cites·19 claims
- 0441US5103104AProcess for measuring the dimensions of a spacerFRENCH STATE MINISTER OF POST·Filed 1990·Granted Apr 7, 1992·14 cites·2 claims
- 0530US5043236AProcess for determining the focussing of a photolithographic apparatusFRANCE ETAT·Filed 1989·Granted Aug 27, 1991·3 cites·10 claims
- 0626US4813781AMethod of measuring the flowing of a materialTISSIER ANNIE·Filed 1987·Granted Mar 21, 1989·4 cites·6 claims
- 0724US5186786AMethod for determining the complete elimination of a thin layer on a non planar substrateFRANCE TELECOM CNET·Filed 1991·Granted Feb 16, 1993·1 cites·6 claims
- 0818US5186040AMethod for measuring the viscosity of a materialFRANCE TELECOM CNET·Filed 1991·Granted Feb 16, 1993·1 cites·2 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →