Inventor · disambiguated record
Ann C. Westerheim
Also filed as: WESTERHEIM ANN C
2 granted patents·42 citations·filing 1995–1998
63Inventor score
Top patents by PatentIndex Score
2 records- 0159US5788869AMethodology for in situ etch stop detection and control of plasma etching process and device design to minimize process chamber contaminationDIGITAL EQUIPMENT CORP·Filed 1995·Granted Aug 4, 1998·28 cites·19 claims
- 0240US6096637AElectromigration-resistant via structureCOMPAQ COMPUTER CORP·Filed 1998·Granted Aug 1, 2000·14 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →