Inventor · disambiguated record
Aparna Chakrapani Sheila-Vadde
Also filed as: SHEILA-VADDE APARNA · SHEILA-VADDE APARNA C · SHEILA-VADDE APARNA CHAKRAPANI
14 granted patents·2 pending applications·44 citations·filing 2008–2024
89Inventor score
Files withGEN ELECTRIC9ROGERS CAREY SHAWN2WANG CHANGTING2MAY ANDRZEJ MICHAL1SHEILA-VADDE APARNA CHAKRAPANI1
Top patents by PatentIndex Score
16 records- 0183US8855947B2Multiphase flow metering with patch antennaSHEILA-VADDE APARNA CHAKRAPANI·Filed 2010·Granted Oct 7, 2014·10 cites·13 claims
- 0283US8436608B2Eddy current inspection system and methodSUN HAIYAN·Filed 2009·Granted May 7, 2013·12 cites·18 claims
- 0381US7948233B2Omnidirectional eddy current array probes and methods of useGEN ELECTRIC·Filed 2008·Granted May 24, 2011·7 cites·19 claims
- 0480US10309910B2System and method to measure salinity of multi-phase fluidsGEN ELECTRIC·Filed 2015·Granted Jun 4, 2019·2 cites·13 claims
- 0579US8884614B2Eddy current array probeWANG CHANGTING·Filed 2011·Granted Nov 11, 2014·5 cites·6 claims
- 0675US8378668B2Method for non-destructive testing of composite systemsGEN ELECTRIC·Filed 2008·Granted Feb 19, 2013·3 cites·17 claims
- 0771US12298274B2Flexible sensor assemblyGEN ELECTRIC·Filed 2022·Granted May 13, 2025·0 cites·20 claims
- 0868US8284900B2Apparatus and method for improved transient response in an electromagnetically controlled X-ray tubeROGERS CAREY SHAWN·Filed 2010·Granted Oct 9, 2012·2 cites·20 claims
- 0967US2025130202A1In-situ monitoring of additively manufactured object using an eddy current array probeGEN ELECTRIC·Filed 2024·Application pending·0 cites
- 1065US8710834B2Drive coil, measurement probe comprising the drive coil and methods utilizing the measurement probeMAY ANDRZEJ MICHAL·Filed 2010·Granted Apr 29, 2014·1 cites·8 claims
- 1164US8280007B2Apparatus and method for improved transient response in an electromagnetically controlled X-ray tubeROGERS CAREY SHAWN·Filed 2010·Granted Oct 2, 2012·1 cites·20 claims
- 1254US9863893B2Sensor apparatus for measurement of material propertiesGEN ELECTRIC·Filed 2013·Granted Jan 9, 2018·1 cites·20 claims
- 1349US12078692B2Apparatus and method for visualizing defects using a magneto-optical effectGEN ELECTRIC·Filed 2022·Granted Sep 3, 2024·0 cites·20 claims
- 1449US9909911B2Multiphase flow measurement using electromagnetic sensorsGEN ELECTRIC·Filed 2014·Granted Mar 6, 2018·0 cites·19 claims
- 1541US10690532B2Multi-phase fluid fraction measurementGEN ELECTRIC·Filed 2015·Granted Jun 23, 2020·0 cites·20 claims
- 1635US2012043962A1Method and apparatus for eddy current inspection of case-hardended metal componentsWANG CHANGTING·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →