Inventor · disambiguated record
Arulmurugan Ambikapathi
Also filed as: AMBIKAPATHI ARULMURUGAN
5 granted patents·2 pending applications·14 citations·filing 2018–2019
73Inventor score
Files withUTECHZONE CO LTD7
Top patents by PatentIndex Score
7 records- 0187US11017259B2Defect inspection method, defect inspection device and defect inspection systemUTECHZONE CO LTD·Filed 2019·Granted May 25, 2021·5 cites·12 claims
- 0275US10878559B2Method and system for evaluating efficiency of manual inspection for defect patternUTECHZONE CO LTD·Filed 2019·Granted Dec 29, 2020·2 cites·18 claims
- 0374US10964004B2Automated optical inspection method using deep learning and apparatus, computer program for performing the method, computer-readable storage medium storing the computer program, and deep learning system thereofUTECHZONE CO LTD·Filed 2018·Granted Mar 30, 2021·3 cites·11 claims
- 0471US11455528B2Automated optical inspection and classification apparatus based on a deep learning system and training apparatus thereofUTECHZONE CO LTD·Filed 2019·Granted Sep 27, 2022·2 cites·14 claims
- 0567US10991088B2Defect inspection system and method using artificial intelligenceUTECHZONE CO LTD·Filed 2019·Granted Apr 27, 2021·2 cites·12 claims
- 0637US2020003828A1Labeling system and method for defect classificationUTECHZONE CO LTD·Filed 2019·Application pending·0 cites
- 0737US2020005084A1Training method of, and inspection system based on, iterative deep learning systemUTECHZONE CO LTD·Filed 2019·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →