Inventor · disambiguated record
Arie Glazer
Also filed as: GLAZER ARIE
6 granted patents·8 pending applications·44 citations·filing 1992–2023
80Inventor score
Top patents by PatentIndex Score
14 records- 0176US9523714B2Electrical inspection of electronic devices using electron-beam induced plasma probesPHOTON DYNAMICS INC·Filed 2014·Granted Dec 20, 2016·4 cites·45 claims
- 0273US7051091B1Remote system to configure management center of point of sale terminalsLIPMAN ELECTRONIC ENGINEERING·Filed 2000·Granted May 23, 2006·11 cites·2 claims
- 0364US7253120B2Selectable area laser assisted processing of substratesORBOTECH LTD·Filed 2003·Granted Aug 7, 2007·10 cites·36 claims
- 0461US7795887B2Photoconductive based electrical testing of transistor arraysORBOTECH LTD·Filed 2006·Granted Sep 14, 2010·1 cites·33 claims
- 0554US2025105065A1Radio frequency induced micro led inspectionORBOTECH LTD·Filed 2023·Application pending·0 cites
- 0650US11596070B2Apparatus for use in preparing a printed circuit board and photosensitive ink for in an ink jet printerORBOTECH LTD·Filed 2020·Granted Feb 28, 2023·0 cites·14 claims
- 0748US2024429106A1Vios modulator sensitivity for micro led backplane array electrical testORBOTECH LTD·Filed 2023·Application pending·0 cites
- 0846US2007287103A1Method and apparatus for fabricating flat panel displays employing partially transparent bordersORBOTECH LTD·Filed 2006·Application pending·0 cites
- 0946US2007287351A1Fabrication of flat panel displays employing formation of spaced apart color filter elementsORBOTECH LTD·Filed 2006·Application pending·0 cites
- 1044US5338424AMasks for applying dots on semiconductor wafersPERSYS TECHNOLOGY LTD·Filed 1992·Granted Aug 16, 1994·18 cites·5 claims
- 1141US2007287080A1Enhancement of inkjet-printed elements using photolithographic techniquesORBOTECH LTD·Filed 2006·Application pending·0 cites
- 1240US2016299103A1Application of electron-beam induced plasma probes to inspection, test, debug and surface modificationsPHOTON DYNAMICS INC·Filed 2014·Application pending·0 cites
- 1331US2004248346A1Inducing semiconductor crystallization using a capillary structureORBOTECH LTD·Filed 2004·Application pending·0 cites
- 1428US2017294291A1APPLICATION OF eBIP TO INSPECTION, TEST, DEBUG AND SURFACE MODIFICATIONSORBOTECH LTD·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →