Inventor · disambiguated record
Armin Holle
Also filed as: HOLLE ARMIN
30 granted patents·1 pending application·713 citations·filing 1992–2021
97Inventor score
Files withBRUKER DALTONIK GMBH15BRUKER FRANZEN ANALYTIK GMBH6SIKORA AG5HOLLE ARMIN4BRUKDER DALTONIK GMBH1
Top patents by PatentIndex Score
31 records- 0195US7989759B2Cleaned daughter ion spectra from maldi ionizationBRUKER DALTONIK GMBH·Filed 2008·Granted Aug 2, 2011·25 cites·12 claims
- 0295US5654545AMass resolution in time-of-flight mass spectrometers with reflectorsBRUKER FRANZEN ANALYTIK GMBH·Filed 1996·Granted Aug 5, 1997·118 cites·14 claims
- 0394US7235781B2Laser system for the ionization of a sample by matrix-assisted laser desorption in mass spectrometric analysisBRUKER DALTONIK GMBH·Filed 2005·Granted Jun 26, 2007·32 cites·22 claims
- 0494US5742049AMethod of improving mass resolution in time-of-flight mass spectrometryBRUKER FRANZEN ANALYTIK GMBH·Filed 1996·Granted Apr 21, 1998·103 cites·8 claims
- 0591US5641959AMethod for improved mass resolution with a TOF-LD sourceBRUKER FRANZEN ANALYTIK GMBH·Filed 1996·Granted Jun 24, 1997·72 cites·8 claims
- 0690US7385192B2Laser system for the ionization of a sample by matrix-assisted laser desorption in mass spectrometric analysisBRUKER DALTONIK GMBH·Filed 2006·Granted Jun 10, 2008·15 cites·21 claims
- 0789US6300627B1Daughter ion spectra with time-of-flight mass spectrometersBRUKER DALTONIK GMBH·Filed 1999·Granted Oct 9, 2001·57 cites·17 claims
- 0888US7408152B2Ion source using matrix-assisted laser desorption/ionizationBRUKER DALTONIK GMBH·Filed 2005·Granted Aug 5, 2008·13 cites·12 claims
- 0987US5294797AMethod and apparatus for generating ions from thermally unstable, non-volatile, large molecules, particularly for a mass spectrometer such as a time-of-flight mass spectrometerBRUKER FRANZEN ANALYTIK GMBH·Filed 1992·Granted Mar 15, 1994·66 cites·27 claims
- 1083US8294086B2Multiplexing daughter ion spectrum acquisition from MALDI ionizationHOLLE ARMIN·Filed 2008·Granted Oct 23, 2012·7 cites·14 claims
- 1183US7989762B2Automatic cleaning of MALDI ion sourcesBRUKER DALTONIK GMBH·Filed 2009·Granted Aug 2, 2011·12 cites·20 claims
- 1282US8536519B2Adjusting the detector amplification in mass spectrometersHOLLE ARMIN·Filed 2009·Granted Sep 17, 2013·6 cites·11 claims
- 1380US12055386B2Method and device for measuring a tubular strandSIKORA AG·Filed 2020·Granted Aug 6, 2024·1 cites·19 claims
- 1479US7301145B2Daughter ion spectra with time-of-flight mass spectrometersBRUKER DALTONIK GMBH·Filed 2005·Granted Nov 27, 2007·5 cites·6 claims
- 1579US6740872B1Space-angle focusing reflector for time-of-flight mass spectrometersBRUKDER DALTONIK GMBH·Filed 2002·Granted May 25, 2004·18 cites·9 claims
- 1679US6734421B2Time-of-flight mass spectrometer with multiplex operationBRUKER DALTONIK GMBH·Filed 2002·Granted May 11, 2004·14 cites·10 claims
- 1778US7541597B2Automatic cleaning of ion sourcesBRUKER DALTONIK GMBH·Filed 2006·Granted Jun 2, 2009·8 cites·11 claims
- 1877US5886345AAccurate mass determination with maldi time-of-flight mass spectrometers using internal reference substancesBRUKER DALTONIK GMBH·Filed 1997·Granted Mar 23, 1999·31 cites·5 claims
- 1976US6703608B2Method and apparatus for generating improved daughter-ion spectra using time-of-flight mass spectrometersBRUKER DALTONIK GMBH·Filed 2001·Granted Mar 9, 2004·12 cites·22 claims
- 2074US5841136ADevice and method for introduction of sample supports into a mass spectrometerBRUKER FRANZEN ANALYTIK GMBH·Filed 1997·Granted Nov 24, 1998·28 cites·7 claims
- 2172US6723983B2High throughput of laser desorption mass spectra in time-of-flight mass spectrometersBRUKER DALTONIK GMBH·Filed 2002·Granted Apr 20, 2004·9 cites·21 claims
- 2272US5463218ADetection of very large molecular ions in a time-of-flight mass spectrometerBRUKER FRANZEN ANALYTIK GMBH·Filed 1994·Granted Oct 31, 1995·23 cites·22 claims
- 2370US8872103B2Laser spot control in maldi mass spectrometersHOLLE ARMIN·Filed 2012·Granted Oct 28, 2014·2 cites·13 claims
- 2469US8274042B2Imaging mass spectrometry for small molecules in two-dimensional samplesHOLLE ARMIN·Filed 2008·Granted Sep 25, 2012·2 cites·19 claims
- 2568US6717131B2Clean daughter-ion spectra using time-of-flight mass spectrometersBRUKER DALTONIK GMBH·Filed 2002·Granted Apr 6, 2004·11 cites·13 claims
- 2666US5910656AAdjustment of the sample support in time-of-flight mass spectrometersBRUKER DALTONIK GMBH·Filed 1997·Granted Jun 8, 1999·19 cites·18 claims
- 2762US7297942B2Method and device for cleaning desorption ion sourcesBRUKER DALTONIK GMBH·Filed 2004·Granted Nov 20, 2007·4 cites·28 claims
- 2861US12474264B2Method and device for determining the refractive index of a surface region of an objectSIKORA AG·Filed 2021·Granted Nov 18, 2025·0 cites·21 claims
- 2959US12461025B2Method and device for detecting defects of a strand-like productSIKORA AG·Filed 2021·Granted Nov 4, 2025·0 cites·20 claims
- 3054US12064911B2Method and device for measuring a tubular strandSIKORA AG·Filed 2019·Granted Aug 20, 2024·0 cites·27 claims
- 3151US2023128231A1Device for determining the speed and/or the length of a productSIKORA AG·Filed 2021·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →