Inventor · disambiguated record
Aron T. Lunde
Also filed as: LUNDE ARON · LUNDE ARON T
16 granted patents·2 pending applications·213 citations·filing 1999–2018
94Inventor score
Top patents by PatentIndex Score
18 records- 0192US7251173B2Combination column redundancy system for a memory arrayMICRON TECHNOLOGY INC·Filed 2005·Granted Jul 31, 2007·29 cites·57 claims
- 0291US6630685B1Probe look ahead: testing parts not currently under a probeheadMICRON TECHNOLOGY INC·Filed 2002·Granted Oct 7, 2003·47 cites·81 claims
- 0388US7170091B2Probe look ahead: testing parts not currently under a probeheadMICRON TECHNOLOGY INC·Filed 2006·Granted Jan 30, 2007·11 cites·16 claims
- 0486US11152333B2Semiconductor device packages with enhanced heat management and related systemsMICRON TECHNOLOGY INC·Filed 2018·Granted Oct 19, 2021·5 cites·12 claims
- 0583US7026646B2Isolation circuitMICRON TECHNOLOGY INC·Filed 2002·Granted Apr 11, 2006·20 cites·33 claims
- 0678US7378290B2Isolation circuitMICRON TECHNOLOGY INC·Filed 2004·Granted May 27, 2008·15 cites·26 claims
- 0775US6522161B2Method and apparatus for properly disabling high current parts in a parallel test environmentMICRON TECHNOLOGY INC·Filed 2001·Granted Feb 18, 2003·18 cites·31 claims
- 0870US6275058B1Method and apparatus for properly disabling high current parts in a parallel test environmentMICRON TECHNOLOGY INC·Filed 1999·Granted Aug 14, 2001·29 cites·28 claims
- 0969US6967348B2Signal sharing circuit with microelectric die isolation featuresMICRON TECHNOLOGY INC·Filed 2002·Granted Nov 22, 2005·24 cites·70 claims
- 1060US7122829B2Probe look ahead: testing parts not currently under a probeheadMICRON TECHNOLOGY INC·Filed 2003·Granted Oct 17, 2006·5 cites·101 claims
- 1151US7344899B2Die assembly and method for forming a die on a waferMICRON TECHNOLOGY INC·Filed 2002·Granted Mar 18, 2008·3 cites·21 claims
- 1250US7208758B2Dynamic integrated circuit clusters, modules including same and methods of fabricatingMICRON TECHNOLOGY INC·Filed 2003·Granted Apr 24, 2007·5 cites·17 claims
- 1348US8144534B2Methods and memory devices for repairing memory cellsLUNDE ARON·Filed 2009·Granted Mar 27, 2012·2 cites·25 claims
- 1448US7952169B2Isolation circuitMICRON TECHNOLOGY INC·Filed 2009·Granted May 31, 2011·0 cites·15 claims
- 1544US7550762B2Isolation circuitMICRON TECHNOLOGY INC·Filed 2006·Granted Jun 23, 2009·0 cites·25 claims
- 1639US8509016B2Methods and memory devices for repairing memory cellsLUNDE ARON·Filed 2012·Granted Aug 13, 2013·0 cites·20 claims
- 1736US2015286529A1Memory device having controller with local memoryMICRON TECHNOLOGY INC·Filed 2015·Application pending·0 cites
- 1835US2005059175A1Dynamic integrated circuit clusters, modules including same and methods of fabricatingFiled 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →