Inventor · disambiguated record
Ariel Shkalim
Also filed as: SHKALIM Ariel
8 granted patents·1 pending application·16 citations·filing 2015–2024
79Inventor score
Files withAPPLIED MATERIALS ISRAEL LTD9
Top patents by PatentIndex Score
9 records- 0189US9613255B2Systems, methods and computer program products for signature detectionAPPLIED MATERIALS ISRAEL LTD·Filed 2015·Granted Apr 4, 2017·11 cites·20 claims
- 0280US11348224B2Mask inspection of a semiconductor specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted May 31, 2022·2 cites·20 claims
- 0376US11276160B2Determining a critical dimension variation of a patternAPPLIED MATERIALS ISRAEL LTD·Filed 2018·Granted Mar 15, 2022·2 cites·17 claims
- 0469US11756188B2Determining a critical dimension variation of a patternAPPLIED MATERIALS ISRAEL LTD·Filed 2022·Granted Sep 12, 2023·0 cites·14 claims
- 0564US11983867B2Mask inspection of a semiconductor specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2022·Granted May 14, 2024·0 cites·20 claims
- 0663US10290087B2Method of generating an examination recipe and system thereofAPPLIED MATERIALS ISRAEL LTD·Filed 2017·Granted May 14, 2019·1 cites·20 claims
- 0754US12400314B2Mask inspection for semiconductor specimen fabricationAPPLIED MATERIALS ISRAEL LTD·Filed 2021·Granted Aug 26, 2025·0 cites·20 claims
- 0852US2025232431A1Coreset based mask inspection for semiconductor specimen fabricationAPPLIED MATERIALS ISRAEL LTD·Filed 2024·Application pending·0 cites
- 0943US12361535B2Mask inspection for semiconductor specimen fabricationAPPLIED MATERIALS ISRAEL LTD·Filed 2021·Granted Jul 15, 2025·0 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →