Inventor · disambiguated record
Arno Simon
Also filed as: SIMON ARNO
20 granted patents·6 pending applications·680 citations·filing 1984–2007
96Inventor score
Files withBRUKER ANALYTISCHE MESSTECHNIK10BRUKER OPTIK GMBH9BRUKER ANALYTIK GMBH2BRUKE ANALYTISCHE MESSTECHNIK1BRUKER ANALTIK GMBH1
Top patents by PatentIndex Score
26 records- 0187US5510619AMethod for the routine identification of plasticsBRUNKER ANALYTISCHE MESSTECHNI·Filed 1994·Granted Apr 23, 1996·79 cites·21 claims
- 0286US5171995ASample holder for optical spectrometer and method for taking a spectrumBRUKER ANALYTISCHE MESSTECHNIK·Filed 1991·Granted Dec 15, 1992·87 cites·18 claims
- 0382US7034944B2Digital FTIR spectrometerBRUKER OPTIK GMBH·Filed 2005·Granted Apr 25, 2006·11 cites·19 claims
- 0479US4927269ACorrection of non-linearities in detectors in fourier transform spectroscopyBRUKE ANALYTISCHE MESSTECHNIK·Filed 1989·Granted May 22, 1990·44 cites·11 claims
- 0575US4594509AInfrared spectrometerBRUKER ANALYTISCHE MESSTECHNIK·Filed 1984·Granted Jun 10, 1986·29 cites·31 claims
- 0671US5493443ALens for a FT-raman microscopeBRUKER ANALYTISCH MEBTECHNIK G·Filed 1993·Granted Feb 20, 1996·44 cites·9 claims
- 0766US5309217AFourier spectrometerBRUKER ANALYTISCHE MESSTECHNIK·Filed 1992·Granted May 3, 1994·32 cites·17 claims
- 0865US5557544ASpectrometer with dynamically coded componentsBRUKER ANALYTISCHE MESSTECHNIK·Filed 1993·Granted Sep 17, 1996·32 cites·15 claims
- 0962US6016440ADevice for infrared (IR) spectroscopic investigations of internal surfaces of a bodyBRUKER ANALYTIK GMBH·Filed 1997·Granted Jan 18, 2000·120 cites·18 claims
- 1056US5499095AFourier spectrometer with exchangeable entrance and exit ports allowing for both internal and external radiation sourcesBRUKER ANALYTISCHE MESSTECHNIK·Filed 1995·Granted Mar 12, 1996·23 cites·17 claims
- 1155US6577891B1IR spectroscopic endoscope with inflatable balloonBRUKER OPTIK GMBH·Filed 1999·Granted Jun 10, 2003·102 cites·2 claims
- 1255US5963322AOptical spectrometer and method of implementing optical spectroscopyBRUKER ANALYTIK GMBH·Filed 1998·Granted Oct 5, 1999·22 cites·15 claims
- 1355US5202686AInfrared fourier transformation spectometer with plural analog-to-digital converters and interleaved amplification factorsBRUKER ANALYTISCHE MESSTECHNIK·Filed 1990·Granted Apr 13, 1993·22 cites·9 claims
- 1452US6539285B1Method and apparatus for process control using fourier transform infrared spectroscopyBRUKER OPTIK GMBH·Filed 2000·Granted Mar 25, 2003·1 cites·14 claims
- 1548US2008037009A1Spectrometer system with IR microscope and electronically switchable detectorsBRUKER OPTIK GMBH·Filed 2007·Application pending·0 cites
- 1647US6930780B2Method for taking a spatially resolved spectrum by means of a fourier-transform (FT)-spectrometer and such spectrometerBRUKER OPTIK GMBH·Filed 2002·Granted Aug 16, 2005·2 cites·9 claims
- 1743US5587831ASemiconductor foil beam-splitter for an infrared spectrometerBRUKER ANALYTISCHE MESSTECHNIK·Filed 1993·Granted Dec 24, 1996·10 cites·6 claims
- 1839US2003103210A1Digital FTIR spectrometerBRUKER OPTIK GMBH·Filed 2002·Application pending·0 cites
- 1938US4760258AOptical instrumentBRUKER ANALYTISCHE MESSTECHNIK·Filed 1986·Granted Jul 26, 1988·6 cites·6 claims
- 2038US2003057374A1Switchable infrared radiation analysis method and deviceBRUKER OPTIK GMBH·Filed 2002·Application pending·0 cites
- 2138US2003103209A1Imaging FTIR spectrometerBRUKER OPTIK GMBH·Filed 2002·Application pending·0 cites
- 2238US2005259250A1Method for measuring a spectrum of a sample by means of an infrared spectrometer and infrared spectrometer of this typeBRUKER OPTIK GMBH·Filed 2005·Application pending·0 cites
- 2337US2003059125A1Method for providing position-sensitive information about an objectFiled 2002·Application pending·0 cites
- 2436US4827134ADevice for collecting samplesBRUKER ANALYTISCHE MESSTECHNIK·Filed 1987·Granted May 2, 1989·5 cites·14 claims
- 2534US6008936AGrazing angle microscopeBRUKER ANALTIK GMBH·Filed 1998·Granted Dec 28, 1999·7 cites·9 claims
- 2628US5397898AOptical component exchanger and methodBRUKER ANALYTISCHE MESSTECHNIK·Filed 1994·Granted Mar 14, 1995·2 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →