Inventor · disambiguated record
Atsushi Ando
Also filed as: ANDO ATSUSHI
74 granted patents·31 pending applications·739 citations·filing 1987–2025
99Inventor score
Files withNUFLARE TECHNOLOGY INC24NIPPON TELEGRAPH & TELEPHONE20TOSHIBA KK14FUJITSU FRONTECH LTD10MATSUSHITA ELECTRIC INDUSTRIAL CO LTD9
Top patents by PatentIndex Score
105 records- 0196US11139138B2Multiple electron beams irradiation apparatusNUFLARE TECHNOLOGY INC·Filed 2020·Granted Oct 5, 2021·5 cites·10 claims
- 0294US5404299AElectronic dictionary systemMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1993·Granted Apr 4, 1995·258 cites·3 claims
- 0391US11145485B2Multiple electron beams irradiation apparatusNUFLARE TECHNOLOGY INC·Filed 2019·Granted Oct 12, 2021·6 cites·7 claims
- 0490US9394137B2Paper sheet handling apparatusFUJITSU FRONTECH LTD·Filed 2015·Granted Jul 19, 2016·6 cites·3 claims
- 0590US9163311B2Film forming apparatusHASEGAWA HARUNARI·Filed 2011·Granted Oct 20, 2015·16 cites·6 claims
- 0687US9603509B2Endoscope channel switching apparatusOLYMPUS CORP·Filed 2014·Granted Mar 28, 2017·9 cites·4 claims
- 0786US10629406B2Optical system adjustment method of image acquisition apparatusNUFLARE TECHNOLOGY INC·Filed 2018·Granted Apr 21, 2020·3 cites·8 claims
- 0885US10734190B2Multiple electron beam irradiation apparatus, multiple electron beam inspection apparatus and multiple electron beam irradiation methodNUFLARE TECHNOLOGY INC·Filed 2019·Granted Aug 4, 2020·3 cites·10 claims
- 0984US10777384B2Multiple beam image acquisition apparatus and multiple beam image acquisition methodNUFLARE TECHNOLOGY INC·Filed 2018·Granted Sep 15, 2020·3 cites·10 claims
- 1084US5989759APattern forming method using alignment from latent image or base pattern on substrateTOSHIBA KK·Filed 1998·Granted Nov 23, 1999·41 cites·22 claims
- 1183US8475315B2Swing internal contact type planetary gear device and rotation drive deviceKOBAYASHI TSUNE·Filed 2011·Granted Jul 2, 2013·9 cites·5 claims
- 1282US7627647B2Information terminalMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2007·Granted Dec 1, 2009·6 cites·6 claims
- 1381US8341240B2Information terminalTAKAYAMA HISASHI·Filed 2011·Granted Dec 25, 2012·2 cites·1 claims
- 1479US10840057B2Multiple beam inspection apparatus and sensitivity correction method for multi-detectorNUFLARE TECHNOLOGY INC·Filed 2019·Granted Nov 17, 2020·1 cites·10 claims
- 1579US7178159B1Information providing apparatusMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2000·Granted Feb 13, 2007·32 cites·17 claims
- 1678US11521641B2Model learning device, estimating device, methods therefor, and programNIPPON TELEGRAPH & TELEPHONE·Filed 2018·Granted Dec 6, 2022·4 cites·9 claims
- 1778US10314466B2Conduit control deviceOLYMPUS CORP·Filed 2017·Granted Jun 11, 2019·3 cites·8 claims
- 1878US8239484B2Information terminalTAKAYAMA HISASHI·Filed 2009·Granted Aug 7, 2012·3 cites·16 claims
- 1977USD946771SMotion assisting deviceJTEKT CORP·Filed 2020·Granted Mar 22, 2022·7 cites·1 claims
- 2077US7246152B2Information terminalMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2001·Granted Jul 17, 2007·8 cites·6 claims
- 2177US6495841B1Charged beam drawing apparatusTOSHIBA KK·Filed 1999·Granted Dec 17, 2002·30 cites·8 claims
- 2277US4755732AMicroangle drive system for stepping motor and microangle drive circuit thereforMELEC CO LTD·Filed 1987·Granted Jul 5, 1988·36 cites·6 claims
- 2376US6940080B2Charged particle beam lithography system, lithography method using charged particle beam, method of controlling charged particle beam, and method of manufacturing semiconductor deviceTOSHIBA KK·Filed 2003·Granted Sep 6, 2005·12 cites·40 claims
- 2474US7635306B2Tripod type constant velocity jointJTEKT CORP·Filed 2006·Granted Dec 22, 2009·6 cites·4 claims
- 2573US11557311B2Satisfaction estimation model learning apparatus, satisfaction estimating apparatus, satisfaction estimation model learning method, satisfaction estimation method, and programNIPPON TELEGRAPH & TELEPHONE·Filed 2018·Granted Jan 17, 2023·2 cites·8 claims
- 2673US6718532B2Charged particle beam exposure system using aperture mask in semiconductor manufactureTOSHIBA KK·Filed 2002·Granted Apr 6, 2004·10 cites·5 claims
- 2772US9012331B2Etching method and non-transitory storage mediumTOKYO ELECTRON LTD·Filed 2014·Granted Apr 21, 2015·3 cites·13 claims
- 2872US6709770B2Steel sheet hot dip coated with Zn-Al-Mg having high Al contentNISSHIN STEEL CO LTD·Filed 2001·Granted Mar 23, 2004·12 cites·4 claims
- 2971US10215718B2Electron beam inspection apparatus and electron beam inspection methodNUFLARE TECHNOLOGY INC·Filed 2017·Granted Feb 26, 2019·1 cites·10 claims
- 3071US8099475B2Information terminalTAKAYAMA HISASHI·Filed 2010·Granted Jan 17, 2012·2 cites·2 claims
- 3171US7095023B2Charged particle beam apparatus, charged particle detection method, and method of manufacturing semiconductor deviceTOSHIBA KK·Filed 2004·Granted Aug 22, 2006·8 cites·19 claims
- 3270US6941008B2Pattern forming methodTOSHIBA KK·Filed 2003·Granted Sep 6, 2005·7 cites·4 claims
- 3370US6147355APattern forming methodTOSHIBA KK·Filed 1999·Granted Nov 14, 2000·22 cites·8 claims
- 3469US12497262B2Paper sheet handling apparatusFUJITSU FRONTECH LTD·Filed 2024·Granted Dec 16, 2025·0 cites·3 claims
- 3569US11964839B2Conveyance route switching mechanism and paper sheet handling apparatusFUJITSU FRONTECH LTD·Filed 2022·Granted Apr 23, 2024·0 cites·5 claims
- 3669US7372027B2Electron beam apparatus and method for manufacturing semiconductor deviceTOKYO ELECTRON LTD·Filed 2005·Granted May 13, 2008·2 cites·16 claims
- 3769US7102147B2Charged particle beam exposure method and method for producing charged particle beam exposure dataTOSHIBA KK·Filed 2002·Granted Sep 5, 2006·8 cites·33 claims
- 3869US6633045B1Assembly part with wiring and for manufacturing system, method of manufacturing such assembly part, and semiconductor manufacturing system constituted using assembly partTOSHIBA KK·Filed 2000·Granted Oct 14, 2003·13 cites·18 claims
- 3968US5994030APattern-forming method and lithographic systemTOSHIBA KK·Filed 1998·Granted Nov 30, 1999·23 cites·10 claims
- 4067US12261015B2Electron beam inspection apparatusNUFLARE TECHNOLOGY INC·Filed 2022·Granted Mar 25, 2025·0 cites·12 claims
- 4167US11756554B2Attribute identification method, and programNIPPON TELEGRAPH & TELEPHONE·Filed 2021·Granted Sep 12, 2023·0 cites·4 claims
- 4266US12339241B2Multiple secondary electron beam alignment method, multiple secondary electron beam alignment apparatus, and electron beam inspection apparatusNUFLARE TECHNOLOGY INC·Filed 2022·Granted Jun 24, 2025·0 cites·11 claims
- 4366US7109501B2Charged particle beam lithography system, pattern drawing method, and method of manufacturing semiconductor deviceTOSHIBA KK·Filed 2004·Granted Sep 19, 2006·6 cites·20 claims
- 4464US2020203121A1Optical system adjustment method of image acquisition apparatusNUFLARE TECHNOLOGY INC·Filed 2020·Application pending·0 cites
- 4562US11694868B2Multi-beam image acquisition apparatus and multi-beam image acquisition methodNUFLARE TECHNOLOGY INC·Filed 2022·Granted Jul 4, 2023·0 cites·10 claims
- 4662US7462106B2Constant velocity universal jointTOYODA MACHINE WORKS LTD·Filed 2005·Granted Dec 9, 2008·8 cites·14 claims
- 4762US2024079200A1Multi-electron beam image acquiring apparatus and multi-electron beam image acquiring methodNUFLARE TECHNOLOGY INC·Filed 2023·Application pending·0 cites
- 4861US12444262B2Paper sheet handling apparatusFUJITSU FRONTECH LTD·Filed 2023·Granted Oct 14, 2025·0 cites·3 claims
- 4961US2025305972A1Electron beam mask inspection apparatusNUFLARE TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 5061US2024282547A1Multi-electron beam image acquisition apparatus and multi-electron beam image acquisition methodNUFLARE TECHNOLOGY INC·Filed 2024·Application pending·0 cites
Showing the top 50 of 105 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →