Inventor · disambiguated record
Atsuhiro Fujii
Also filed as: FUJII ATSUHIRO
20 granted patents·3 pending applications·226 citations·filing 1988–2024
93Inventor score
Top patents by PatentIndex Score
23 records- 0169US5047127AOzone generating methodMITSUBISHI ELECTRIC CORP·Filed 1990·Granted Sep 10, 1991·22 cites·2 claims
- 0268US5077238AMethod of manufacturing a semiconductor device with a planar interlayer insulating filmMITSUBISHI ELECTRIC CORP·Filed 1989·Granted Dec 31, 1991·37 cites·13 claims
- 0367US4984055ASemiconductor device having a plurality of conductive layers and manufacturing method thereforMITSUBISHI ELECTRIC CORP·Filed 1988·Granted Jan 8, 1991·33 cites·12 claims
- 0466US7377736B1Cylinder, load port using it, and production systemCKD CORP·Filed 2000·Granted May 27, 2008·16 cites·22 claims
- 0563US5262356AMethod of treating a substrate wherein the flow rates of the treatment gases are equalMITSUBISHI ELECTRIC CORP·Filed 1991·Granted Nov 16, 1993·35 cites·17 claims
- 0662US2025029225A1Spectrum Processing Device, Specimen Analyzing Device, and Spectrum Processing MethodJEOL LTD·Filed 2024·Application pending·0 cites
- 0759US6140656AIon implantation apparatus, ion implantation method and semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 1995·Granted Oct 31, 2000·14 cites·4 claims
- 0859US2024239655A1Deuterium recovery method and deuterium recovery equipmentTAIYO NIPPON SANSO CORP·Filed 2022·Application pending·0 cites
- 0958US12469675B2Phase analyzer, sample analyzer, and analysis methodJEOL LTD·Filed 2022·Granted Nov 11, 2025·0 cites·7 claims
- 1057US12467888B2Phase analyzer, sample analyzer, and analysis methodJEOL LTD·Filed 2022·Granted Nov 11, 2025·0 cites·7 claims
- 1157US5132774ASemiconductor device including interlayer insulating filmMITSUBISHI ELECTRIC CORP·Filed 1990·Granted Jul 21, 1992·29 cites·6 claims
- 1251US5882418AJig for use in CVD and method of manufacturing jig for use in CVDMITSUBISHI ELECTRIC CORP·Filed 1997·Granted Mar 16, 1999·15 cites·5 claims
- 1350US5250468AMethod of manufacturing semiconductor device including interlaying insulating filmMITSUBISHI ELECTRIC CORP·Filed 1992·Granted Oct 5, 1993·21 cites·5 claims
- 1449US10191078B2Acceleration sensorPANASONIC IP MAN CO LTD·Filed 2016·Granted Jan 29, 2019·0 cites·7 claims
- 1548US12498269B2Phase analyzer, sample analyzer, and analysis methodJEOL LTD·Filed 2023·Granted Dec 16, 2025·0 cites·6 claims
- 1645US11885277B2Method and device for controlling fuel injection to engineNIKKI CO LTD·Filed 2022·Granted Jan 30, 2024·0 cites·19 claims
- 1744US6760115B2Carrier shape measurement deviceNIKON CORP·Filed 2001·Granted Jul 6, 2004·4 cites·23 claims
- 1843US10511700B2Communication terminal with first application displaying status of second applicationRICOH CO LTD·Filed 2017·Granted Dec 17, 2019·0 cites·13 claims
- 1943US9819704B2Transmission system, transmission management apparatus, and recording mediumRICOH CO LTD·Filed 2015·Granted Nov 14, 2017·0 cites·12 claims
- 2039US10581936B2Information processing terminal, management system, communication system, information processing method, and recording mediumINOUE TAKERU·Filed 2017·Granted Mar 3, 2020·0 cites·16 claims
- 2139US10033966B2Information processing apparatus, communication system, and information processing methodINOUE TAKERU·Filed 2017·Granted Jul 24, 2018·0 cites·15 claims
- 2238US2018077207A1Information processing terminal, communication system, information processing method, and recording mediumINOUE TAKERU·Filed 2017·Application pending·0 cites
- 2336US10715666B2Communication terminal, communication system, communication management method, and mediumFUJII ATSUHIRO·Filed 2016·Granted Jul 14, 2020·0 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →