Inventor · disambiguated record
Atsuo Fushida
Also filed as: FUSHIDA ATSUO
7 granted patents·202 citations·filing 1994–2013
86Inventor score
Top patents by PatentIndex Score
7 records- 0180US6008111AMethod of manufacturing semiconductor deviceFUJITSU LTD·Filed 1997·Granted Dec 28, 1999·53 cites·18 claims
- 0278US5635426AMethod of making a semiconductor device having a silicide local interconnectFUJITSU LTD·Filed 1995·Granted Jun 3, 1997·63 cites·31 claims
- 0368US5482895AMethod of manufacturing semiconductor devices having silicide electrodesFUJITSU LTD·Filed 1994·Granted Jan 9, 1996·35 cites·11 claims
- 0464US6197646B1Manufacture of semiconductor device with salicide electrodeFUJITSU LTD·Filed 1996·Granted Mar 6, 2001·26 cites·34 claims
- 0560US5576244AMethod of manufacturing semiconductor devices having silicide electrodesFUJITSU LTD·Filed 1995·Granted Nov 19, 1996·24 cites·11 claims
- 0653US8073241B2Defect source analysis method, defect source analysis apparatus, and method of manufacturing semiconductor deviceFUSHIDA ATSUO·Filed 2006·Granted Dec 6, 2011·1 cites·16 claims
- 0744US8835327B2Method of manufacturing semiconductor deviceFUJITSU SEMICONDUCTOR LTD·Filed 2013·Granted Sep 16, 2014·0 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →