Inventor · disambiguated record
Atsushi Kida
Also filed as: KIDA ATSUSHI
28 granted patents·509 citations·filing 1996–2021
97Inventor score
Top patents by PatentIndex Score
28 records- 0194US6148097AOptical member inspecting apparatus and method of inspection thereofASAHI OPTICAL CO LTD·Filed 1996·Granted Nov 14, 2000·47 cites·26 claims
- 0293US5828500AOptical element inspecting apparatusASAHI OPTICAL CO LTD·Filed 1996·Granted Oct 27, 1998·76 cites·23 claims
- 0387US6476909B1Optical member inspecting apparatus and method of inspection thereofASAHI OPTICAL CO LTD·Filed 2000·Granted Nov 5, 2002·16 cites·9 claims
- 0482US6804386B1Optical member inspecting apparatus and method of inspection thereofASAHI OPTICAL CO LTD·Filed 2000·Granted Oct 12, 2004·11 cites·10 claims
- 0581US5847822AOptical element inspecting apparatusASAHI OPTICAL CO LTD·Filed 1996·Granted Dec 8, 1998·55 cites·38 claims
- 0677US6697513B1Optical member inspecting apparatus and method of inspection thereofASAHI OPTICAL CO LTD·Filed 2000·Granted Feb 24, 2004·9 cites·9 claims
- 0775US6349145B1Optical member inspecting apparatus and method of inspection thereofASAHI OPTICAL CO LTD·Filed 2000·Granted Feb 19, 2002·8 cites·7 claims
- 0872US6108497AStandard measurement scale and markers for defining standard measurement scaleASAHI OPTICAL CO LTD·Filed 1997·Granted Aug 22, 2000·43 cites·6 claims
- 0972US5835207AOptical member inspecting apparatusASAHI OPTICAL CO LTD·Filed 1996·Granted Nov 10, 1998·31 cites·23 claims
- 1068US6636625B1Optical member inspecting apparatus and method of inspection thereofASAHI OPTICAL CO LTD·Filed 2000·Granted Oct 21, 2003·5 cites·18 claims
- 1167US6144761APhotogrammetric analytical measurement systemASAHI OPTICAL CO LTD·Filed 1998·Granted Nov 7, 2000·42 cites·20 claims
- 1266US6600511B1Camera for use in photogrammetric analytical measurementPENTAX CORP·Filed 1998·Granted Jul 29, 2003·42 cites·13 claims
- 1364US6314200B1Optical member inspecting apparatus and method of inspection thereofASAHI OPTICAL CO LTD·Filed 2000·Granted Nov 6, 2001·4 cites·1 claims
- 1461US6304669B1Photogrammetric analytical measurement systemASAHI OPTICAL CO LTD·Filed 1998·Granted Oct 16, 2001·32 cites·8 claims
- 1560US11776309B2Image processing method, image processing apparatus and non-transitory computer readable mediumROLAND CORP·Filed 2021·Granted Oct 3, 2023·0 cites·23 claims
- 1660US6351554B1Optical member inspecting apparatus and method of inspection thereofASAHI KUGAKU KOGYO KABUSHIKI K·Filed 2000·Granted Feb 26, 2002·4 cites·3 claims
- 1760US6339683B1Standard measurement scale and markers for defining standard measurement scaleASAHI OPTICAL CO LTD·Filed 2000·Granted Jan 15, 2002·13 cites·14 claims
- 1859US6535627B1Optical member inspecting apparatus and method of inspection thereofASAHI OPTICAL CO LTD·Filed 2000·Granted Mar 18, 2003·3 cites·5 claims
- 1956US5995765ACamera with distance-measuring sensor unit for use in photogrammetric analytical measurementASAHI OPTICAL CO LTD·Filed 1998·Granted Nov 30, 1999·24 cites·24 claims
- 2054US11120533B2Information processing method and information processing apparatusROLAND CORP·Filed 2019·Granted Sep 14, 2021·0 cites·17 claims
- 2154US6628803B1Device for calculating positional data of standard points of photogrammetric targetPENTAX CORP·Filed 1999·Granted Sep 30, 2003·23 cites·5 claims
- 2254US6477264B1Optical member inspecting apparatus and method of inspection thereofASAHI OPTICAL CO LTD·Filed 2000·Granted Nov 5, 2002·2 cites·9 claims
- 2354US6430310B1Optical member inspecting apparatus and method of inspection thereofASAHI OPTICAL CO LTD·Filed 2000·Granted Aug 6, 2002·2 cites·7 claims
- 2449US6717683B1Target for photogrammetric analytical measurement systemPENTAX CORP·Filed 1999·Granted Apr 6, 2004·15 cites·6 claims
- 2549US6434263B1Optical member inspecting apparatus and method of inspection thereofASAHI OPTICAL CO LTD·Filed 2000·Granted Aug 13, 2002·1 cites·3 claims
- 2649US6427023B1Optical member inspecting apparatus and method of inspection thereofASAHI OPTICAL CO LTD·Filed 2000·Granted Jul 30, 2002·1 cites·5 claims
- 2740US6788804B1Optical member inspecting apparatus and method of inspection thereofASAHI OPTICAL CO LTD·Filed 2000·Granted Sep 7, 2004·0 cites·4 claims
- 2840US6363165B1Optical member inspecting apparatus and method of inspection thereofASAHI OPTICAL CO LTD·Filed 2000·Granted Mar 26, 2002·0 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →