Inventor · disambiguated record
Atsushi Oga
Also filed as: OGA ATSUSHI
8 granted patents·4 pending applications·27 citations·filing 2004–2024
80Inventor score
Top patents by PatentIndex Score
12 records- 0194US9768233B1Semiconductor device and method of manufacturing the sameTOSHIBA MEMORY CORP·Filed 2016·Granted Sep 19, 2017·14 cites·11 claims
- 0291US10192928B2Semiconductor device and method of manufacturing the sameTOSHIBA MEMORY CORP·Filed 2017·Granted Jan 29, 2019·7 cites·9 claims
- 0381US9721961B2Semiconductor memory deviceTOSHIBA KK·Filed 2015·Granted Aug 1, 2017·4 cites·18 claims
- 0468US10957702B2Semiconductor memory deviceTOSHIBA MEMORY CORP·Filed 2019·Granted Mar 23, 2021·1 cites·9 claims
- 0557US2024321819A1Method for manufacturing semiconductor device and semiconductor deviceKIOXIA CORP·Filed 2024·Application pending·0 cites
- 0655US2023411228A1Semiconductor device and method of manufacturing the sameKIOXIA CORP·Filed 2023·Application pending·0 cites
- 0751US8598651B2Semiconductor device with transistor having gate insulating film with various thicknesses and manufacturing method thereofOGA ATSUSHI·Filed 2011·Granted Dec 3, 2013·1 cites·4 claims
- 0847US11515300B2Semiconductor memory deviceKIOXIA CORP·Filed 2020·Granted Nov 29, 2022·0 cites·14 claims
- 0944US2007243684A1Semiconductor device and method of manufaturing the sameNEC ELECTRONICS CORP·Filed 2007·Application pending·0 cites
- 1043US10211259B2Semiconductor memory device and method of manufacturing the sameTOSHIBA MEMORY CORP·Filed 2017·Granted Feb 19, 2019·0 cites·8 claims
- 1139US9704922B2Semiconductor memory device and method of manufacturing the same while avoiding process damage to a variable resistance filmTOSHIBA KK·Filed 2015·Granted Jul 11, 2017·0 cites·7 claims
- 1236US2005087774A1Semiconductor device and method of manufacturing the sameNEC ELECTRONICS CORP·Filed 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →