Inventor · disambiguated record
Attilio J. Rainal
Also filed as: RAINAL ATTILIO J · RAINAL ATTILIO JOSEPH
11 granted patents·582 citations·filing 1977–1997
93Inventor score
Top patents by PatentIndex Score
11 records- 0197US4157612AMethod for improving the transmission properties of a connectorized flat cable interconnection assemblyBELL TELEPHONE LABOR INC·Filed 1977·Granted Jun 12, 1979·150 cites·16 claims
- 0293US5864089ALow-crosstalk modular electrical connector assemblyLUCENT TECHNOLOGIES INC·Filed 1997·Granted Jan 26, 1999·109 cites·15 claims
- 0393US4498122AHigh-speed, high pin-out LSI chip packageAT & T BELL LAB·Filed 1982·Granted Feb 5, 1985·101 cites·11 claims
- 0479US6058256ATechnique for effectively routing conduction paths in circuit layoutsLUCENT TECHNOLOGIES INC·Filed 1996·Granted May 2, 2000·62 cites·15 claims
- 0576US5689356ASystem and method for minimizing nonlinear distortion in optical communication systems employing laser intensity modulationLUCENT TECHNOLOGIES INC·Filed 1996·Granted Nov 18, 1997·56 cites·10 claims
- 0665US5304856AArticle comprising a balanced driver circuit with less power dissipation than conventional circuitAT & T BELL LAB·Filed 1992·Granted Apr 19, 1994·25 cites·10 claims
- 0759US5502644AProcess and apparatus for auditing crosstalk and characteristic impedances of printed wiring boardsAT & T CORP·Filed 1994·Granted Mar 26, 1996·45 cites·10 claims
- 0851US5646543AIntegrated circuit having reduced inductive noiseLUCENT TECHNOLOGIES INC·Filed 1995·Granted Jul 8, 1997·18 cites·18 claims
- 0948US5519353ABalanced driver circuit for eliminating inductive noiseAT & T CORP·Filed 1992·Granted May 21, 1996·9 cites·4 claims
- 1031US5767995ASystem and methods for assessing the suitability of analog lasers for broadband access applicationsLUCENT TECHNOLOGIES INC·Filed 1996·Granted Jun 16, 1998·4 cites·14 claims
- 1131US5329170ABalanced circuitry for reducing inductive noise of external chip interconnectionsAT & T BELL LAB·Filed 1993·Granted Jul 12, 1994·3 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →