Inventor · disambiguated record
Atsuhiro Sato
Also filed as: SATO ATSUHIRO
67 granted patents·14 pending applications·525 citations·filing 2001–2025
99Inventor score
Top patents by PatentIndex Score
81 records- 0198US11315950B2Semiconductor memory deviceKIOXIA CORP·Filed 2020·Granted Apr 26, 2022·4 cites·12 claims
- 0297US7796439B2Semiconductor memory device and write method thereofTOSHIBA KK·Filed 2008·Granted Sep 14, 2010·61 cites·22 claims
- 0394US7092294B2Nonvolatile semiconductor memoryTOSHIBA KK·Filed 2006·Granted Aug 15, 2006·26 cites·7 claims
- 0492US10818691B2Semiconductor memory deviceTOSHIBA MEMORY CORP·Filed 2019·Granted Oct 27, 2020·4 cites·13 claims
- 0592US7977733B2Non-volatile semiconductor storage deviceTOSHIBA KK·Filed 2009·Granted Jul 12, 2011·15 cites·17 claims
- 0691US8022464B2Semiconductor memory device and manufacturing method thereofTOSHIBA KK·Filed 2009·Granted Sep 20, 2011·16 cites·14 claims
- 0791US6853029B2Non-volatile semiconductor memory device with multi-layer gate structureTOSHIBA KK·Filed 2002·Granted Feb 8, 2005·58 cites·12 claims
- 0890US10381084B2Semiconductor memory deviceTOSHIBA MEMORY CORP·Filed 2018·Granted Aug 13, 2019·5 cites·16 claims
- 0989US12274065B2Semiconductor memory deviceKIOXIA CORP·Filed 2024·Granted Apr 8, 2025·0 cites·20 claims
- 1089US9437300B2Semiconductor memory deviceTOSHIBA KK·Filed 2014·Granted Sep 6, 2016·12 cites·20 claims
- 1189US7122430B2Nonvolatile semiconductor memory and manufacturing method for the sameTOSHIBA KK·Filed 2005·Granted Oct 17, 2006·15 cites·3 claims
- 1289US6798038B2Manufacturing method of semiconductor device with filling insulating film into trenchTOSHIBA KK·Filed 2002·Granted Sep 28, 2004·43 cites·1 claims
- 1388US8314455B2Non-volatile semiconductor storage deviceSHIINO YASUHIRO·Filed 2011·Granted Nov 20, 2012·9 cites·11 claims
- 1486US6667507B2Flash memory having memory section and peripheral circuit sectionTOSHIBA KK·Filed 2001·Granted Dec 23, 2003·24 cites·8 claims
- 1585US7663178B2Nonvolatile semiconductor memory with resistance elements and method of manufacturing the sameTOSHIBA KK·Filed 2007·Granted Feb 16, 2010·10 cites·8 claims
- 1684US7745884B2Nonvolatile semiconductor memoryTOSHIBA KK·Filed 2007·Granted Jun 29, 2010·8 cites·16 claims
- 1783US12022657B2Semiconductor memory deviceKIOXIA CORP·Filed 2023·Granted Jun 25, 2024·0 cites·11 claims
- 1883US7361951B2Flash memory having memory section and peripheral circuit sectionTOSHIBA KK·Filed 2005·Granted Apr 22, 2008·6 cites·10 claims
- 1983US2025212406A1Semiconductor memory deviceKIOXIA CORP·Filed 2025·Application pending·0 cites
- 2082US7505312B2Nonvolatile semiconductor memory device capable of controlling proximity effect due to coupling between adjacent charge storage layersTOSHIBA KK·Filed 2006·Granted Mar 17, 2009·16 cites·9 claims
- 2182US7371654B2Manufacturing method of semiconductor device with filling insulating film into trenchTOSHIBA KK·Filed 2006·Granted May 13, 2008·8 cites·8 claims
- 2282US2025182828A1Semiconductor memory deviceKIOXIA CORP·Filed 2025·Application pending·0 cites
- 2381US12254929B2Semiconductor memory deviceKIOXIA CORP·Filed 2023·Granted Mar 18, 2025·0 cites·16 claims
- 2480US7045423B2Non-volatile semiconductor memory device with multi-layer gate structureTOSHIBA KK·Filed 2004·Granted May 16, 2006·24 cites·4 claims
- 2579US11621278B2Semiconductor memory deviceKIOXIA CORP·Filed 2022·Granted Apr 4, 2023·0 cites·9 claims
- 2679US10074434B2Semiconductor memory deviceTOSHIBA MEMORY CORP·Filed 2017·Granted Sep 11, 2018·2 cites·20 claims
- 2778US9337145B2Semiconductor memory deviceTOSHIBA KK·Filed 2015·Granted May 10, 2016·2 cites·9 claims
- 2877US7928496B2Semiconductor memory device and manufacturing method thereofTOSHIBA KK·Filed 2007·Granted Apr 19, 2011·6 cites·6 claims
- 2977US7494869B2Semiconductor integrated circuit device and manufacturing method thereofTOSHIBA KK·Filed 2006·Granted Feb 24, 2009·7 cites·7 claims
- 3076US11705204B2Semiconductor memory deviceKIOXIA CORP·Filed 2022·Granted Jul 18, 2023·0 cites·12 claims
- 3176US7906804B2Nonvolatile semiconductor memory device and manufacturing method thereofTOSHIBA KK·Filed 2007·Granted Mar 15, 2011·5 cites·12 claims
- 3276US7692252B2EEPROM array with well contactsTOSHIBA KK·Filed 2006·Granted Apr 6, 2010·5 cites·4 claims
- 3373US9893078B2Semiconductor memory deviceTOSHIBA MEMORY CORP·Filed 2015·Granted Feb 13, 2018·1 cites·19 claims
- 3473US8088661B2Nonvolatile semiconductor memory with resistance elements and method of manufacturing the sameARAI FUMITAKA·Filed 2010·Granted Jan 3, 2012·3 cites·12 claims
- 3573US6921960B2Capacitor element with an opening portion formed in a peripheral circuitTOSHIBA KK·Filed 2001·Granted Jul 26, 2005·19 cites·27 claims
- 3672US11270773B2Semiconductor memory deviceKIOXIA CORP·Filed 2020·Granted Mar 8, 2022·0 cites·13 claims
- 3772US7705394B2Nonvolatile semicondutor memory with metallic silicide film electrically connected to a control gate electrode layerTOSHIBA KK·Filed 2006·Granted Apr 27, 2010·6 cites·18 claims
- 3871US8158479B2Semiconductor memory device and manufacturing method thereofSATO ATSUHIRO·Filed 2011·Granted Apr 17, 2012·2 cites·8 claims
- 3970US9768189B2Semiconductor memory deviceTOSHIBA MEMORY CORP·Filed 2016·Granted Sep 19, 2017·1 cites·18 claims
- 4070US7183615B2Nonvolatile semiconductor memory and manufacturing method for the sameTOSHIBA KK·Filed 2004·Granted Feb 27, 2007·15 cites·14 claims
- 4170US7012295B2Semiconductor memory with peripheral transistors having gate insulator thickness being thinner than thickness of memory and select transistorsTOSHIBA KK·Filed 2004·Granted Mar 14, 2006·13 cites·17 claims
- 4268US8139407B2Nonvolatile semiconductor memory device including NAND-type flash memory and the likeSATO ATSUHIRO·Filed 2010·Granted Mar 20, 2012·3 cites·6 claims
- 4368US8133782B2Nonvolatile semiconductor memory device and manufacturing method thereofAKAHORI HIROSHI·Filed 2011·Granted Mar 13, 2012·2 cites·5 claims
- 4468US7031195B2Nonvolatile semiconductor memory having a control gate driver transistor whose gate insulator thickness is greater than that of a select gate driver transistorTOSHIBA KK·Filed 2004·Granted Apr 18, 2006·15 cites·18 claims
- 4568US7020025B2Nonvolatile semiconductor memoryTOSHIBA KK·Filed 2004·Granted Mar 28, 2006·11 cites·20 claims
- 4666US9361988B2Semiconductor memory deviceTOSHIBA KK·Filed 2014·Granted Jun 7, 2016·1 cites·20 claims
- 4766US7649221B2Nonvolatile semiconductor memory and a fabrication method for the sameTOSHIBA KK·Filed 2007·Granted Jan 19, 2010·2 cites·17 claims
- 4866US2025223400A1Thermoplastic resin and optical lens including sameMITSUBISHI GAS CHEMICAL CO·Filed 2023·Application pending·0 cites
- 4965US10461093B2Semiconductor memory deviceTOSHIBA MEMORY CORP·Filed 2018·Granted Oct 29, 2019·0 cites·20 claims
- 5065US6927139B2Nonvolatile semiconductor memory and manufacturing method for the sameTOSHIBA KK·Filed 2003·Granted Aug 9, 2005·9 cites·20 claims
Showing the top 50 of 81 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →