Inventor · disambiguated record
Axel Seikowsky
Also filed as: SEIKOWSKY AXEL
3 granted patents·3 pending applications·99 citations·filing 1994–2021
73Inventor score
Files withMICRO EPSILON MESSTECHNIK2GROMMER WERNER1HOENICKA REINHOLD1MICRO EPSILON MESSTECHNIK GMBH & CO K G1MICRO EPSILON MESSTECHNIK GMBH & CO KG1
Top patents by PatentIndex Score
6 records- 0182US5525903AEddy current method of acquiring the surface layer properties of a metallic targetMICRO EPSILON MESSTECHNIK·Filed 1994·Granted Jun 11, 1996·63 cites·13 claims
- 0277US8833160B2Sensor in which the sensor element is part of the sensor housingHOENICKA REINHOLD·Filed 2010·Granted Sep 16, 2014·5 cites·15 claims
- 0335US6318153B1Non-contact film thickness gauging sensorMICRO EPSILON MESSTECHNIK·Filed 1996·Granted Nov 20, 2001·31 cites·13 claims
- 0432US2019003857A1Sensor and sensor elementMICRO EPSILON MESSTECHNIK GMBH & CO KG·Filed 2017·Application pending·0 cites
- 0529US2023366489A1Device for guiding a line through a wall in a pressure-tight manner, and method for producing the deviceMICRO EPSILON MESSTECHNIK GMBH & CO K G·Filed 2021·Application pending·0 cites
- 0628US2012146625A1Sensor arrangementGROMMER WERNER·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →