Inventor · disambiguated record
Ayumi Doi
Also filed as: DOI AYUMI
4 granted patents·5 pending applications·5 citations·filing 2012–2024
61Inventor score
Top patents by PatentIndex Score
9 records- 0179US11428652B2Pattern evaluation system and pattern evaluation methodHITACHI HIGH TECH CORP·Filed 2020·Granted Aug 30, 2022·2 cites·18 claims
- 0274US2025327663A1Pattern Measurement Method, Measurement System, and Computer-Readable MediumHITACHI HIGH TECH CORP·Filed 2024·Application pending·0 cites
- 0368US9451215B2Control circuit apparatus and endoscope apparatusOLYMPUS CORP·Filed 2012·Granted Sep 20, 2016·3 cites·6 claims
- 0451US2021404801A1Pattern Measurement Method, Measurement System, and Computer-Readable MediumHITACHI HIGH TECH CORP·Filed 2018·Application pending·0 cites
- 0551US2023386781A1Charged Particle Beam Device, Charged Particle Beam System, and Adjustment MethodHITACHI HIGH TECH CORP·Filed 2023·Application pending·0 cites
- 0649US10854420B2Pattern evaluation deviceHITACHI HIGH TECH CORP·Filed 2016·Granted Dec 1, 2020·0 cites·6 claims
- 0743US10141159B2Sample observation device having a selectable acceleration voltageHITACHI HIGH TECH CORP·Filed 2014·Granted Nov 27, 2018·0 cites·13 claims
- 0840US2013100274A1Endoscope apparatusOLYMPUS CORP·Filed 2012·Application pending·0 cites
- 0938US2024240937A1Depth Measurement Device, Depth Measurement System, and Depth Index Calculation MethodHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →