Inventor · disambiguated record

Baheej Bathish

Also filed as: BATHISH BAHEEJ

2 granted patents·1 pending application·4 citations·filing 2022–2025

47Inventor score

Technology areasH10P

Files withCAMTEK LTD3

Top patents by PatentIndex Score

3 records

0191US11828713B1Semiconductor inspection tool system and method for wafer edge inspectionCAMTEK LTD·Filed 2022·Granted Nov 28, 2023·4 cites·15 claims
0276US2025290869A1Semiconductor inspection tool system and method for wafer edge inspectionCAMTEK LTD·Filed 2025·Application pending·0 cites
0374US12320757B2Semiconductor inspection tool system and method for wafer edge inspectionCAMTEK LTD·Filed 2023·Granted Jun 3, 2025·0 cites·31 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →