Inventor · disambiguated record
Barry N. Breen
Also filed as: BREEN BARRY N · BREEN BARRY NEAL
6 granted patents·6 pending applications·386 citations·filing 1991–2024
88Inventor score
Files withAVX CORP5BIOSENSE WEBSTER ISRAEL LTD4CEREL CERAMIC TECHNOLOGIES LTD1DAGAN OFER1REAL TIME RADIOGRAPHY LTD1
Top patents by PatentIndex Score
12 records- 0195US5166656AThin film surface mount fusesAVX CORP·Filed 1992·Granted Nov 24, 1992·133 cites·6 claims
- 0293US5228188AMethod of making thin film surface mount fusesAVX CORP·Filed 1992·Granted Jul 20, 1993·83 cites·5 claims
- 0391US5398400AMethod of making high accuracy surface mount inductorsAVX CORP·Filed 1993·Granted Mar 21, 1995·64 cites·17 claims
- 0489US5296833AHigh voltage, laminated thin film surface mount fuse and manufacturing method thereforAVX CORP·Filed 1993·Granted Mar 22, 1994·68 cites·6 claims
- 0582US5363080AHigh accuracy surface mount inductorAVX CORP·Filed 1991·Granted Nov 8, 1994·35 cites·7 claims
- 0678US2025057438A1System and method of sensing catheter's location and forceBIOSENSE WEBSTER ISRAEL LTD·Filed 2024·Application pending·0 cites
- 0775US2025057440A1Magnetic field sensorBIOSENSE WEBSTER ISRAEL LTD·Filed 2024·Application pending·0 cites
- 0875US2025062068A1Electric components including coils and methods to fabricate the same by 3d printingBIOSENSE WEBSTER ISRAEL LTD·Filed 2024·Application pending·0 cites
- 0960US2025009247A1System and method of sensing catheters location and forceBIOSENSE WEBSTER ISRAEL LTD·Filed 2024·Application pending·0 cites
- 1046US7170065B2Direct detection of high-energy single photonsDAGAN OFER·Filed 2003·Granted Jan 30, 2007·3 cites·32 claims
- 1144US2007131555A1Apparatus for manufacturing components using electrophoretic depositionCEREL CERAMIC TECHNOLOGIES LTD·Filed 2005·Application pending·0 cites
- 1237US2005160979A1Method and apparatus for applying a polycrystalline film to a substrateREAL TIME RADIOGRAPHY LTD·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →