Inventor · disambiguated record
Bas De Heij
Also filed as: DE HEIJ BAS
7 granted patents·4 pending applications·5 citations·filing 2001–2021
71Inventor score
Top patents by PatentIndex Score
11 records- 0183US9851297B2Nephelometric turbidimeter and method for detection of the contamination of a sample cuvette of a nephelometric turbidimeterHACH LANGE GMBH·Filed 2013·Granted Dec 26, 2017·5 cites·7 claims
- 0258US10126236B2Method for detection of the contamination of a sample cuvette of a nephelometric turbidimeterHACH LANGE GMBH·Filed 2017·Granted Nov 13, 2018·0 cites·4 claims
- 0351US2024003805A1A process photometer arrangementHACH LANGE GMBH·Filed 2021·Application pending·0 cites
- 0450US2012195799A1Process analyzerFARJAM ARIA·Filed 2010·Application pending·0 cites
- 0550US2023358671A1Method for determining ammoniumHACH LANGE GMBH·Filed 2021·Application pending·0 cites
- 0648US9638626B2Nephelometric turbidimeter vial arrangementHACH LANGE GMBH·Filed 2015·Granted May 2, 2017·0 cites·20 claims
- 0745US9410882B2TurbidimeterHACH LANGE GMBH·Filed 2013·Granted Aug 9, 2016·0 cites·10 claims
- 0844US9784669B2Nephelometric turbidimeterHACH LANGE GMBH·Filed 2015·Granted Oct 10, 2017·0 cites·11 claims
- 0943US10408729B2Nephelometric turbidimeter and method for controlling the humidity of venting air in a nephelometric turbidimeterHACH LANGE GMBH·Filed 2015·Granted Sep 10, 2019·0 cites·19 claims
- 1042US9546944B2Nephelometric process turbidimeterHACH LANGE GMBH·Filed 2015·Granted Jan 17, 2017·0 cites·9 claims
- 1135US2004082076A1Device and method for the non-contact application of micro-droplets on a substrateFiled 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →