Inventor · disambiguated record
Barton T. Hickman
Also filed as: HICKMAN BARTON T
22 granted patents·4 pending applications·117 citations·filing 2000–2025
93Inventor score
Top patents by PatentIndex Score
26 records- 0194US11002764B2Systems and methods for synchronizing multiple test and measurement instrumentsTEKTRONIX INC·Filed 2020·Granted May 11, 2021·3 cites·20 claims
- 0292US10041975B2Automatic probe ground connection checking techniquesTEKTRONIX INC·Filed 2015·Granted Aug 7, 2018·4 cites·3 claims
- 0392US9194888B2Automatic probe ground connection checking techniquesTEKTRONIX INC·Filed 2012·Granted Nov 24, 2015·7 cites·7 claims
- 0490US6725170B1Smart probe apparatus and method for automatic self-adjustment of an oscilloscope's bandwidthTEKTRONIX INC·Filed 2000·Granted Apr 20, 2004·46 cites·14 claims
- 0583US12493053B2Precision, high bandwidth, switching attenuatorTEKTRONIX INC·Filed 2023·Granted Dec 9, 2025·0 cites·20 claims
- 0682US9651579B2Multi-scope control and synchronization systemTEKTRONIX INC·Filed 2015·Granted May 16, 2017·3 cites·14 claims
- 0778US6629048B1Measurement test instrument and associated voltage management system for accessory deviceTEKTRONIX INC·Filed 2000·Granted Sep 30, 2003·28 cites·15 claims
- 0874US11808786B2Precision, high bandwidth, switching attenuatorTEKTRONIX INC·Filed 2022·Granted Nov 7, 2023·0 cites·23 claims
- 0974US11454651B2Automatic probe ground connection checking techniquesTEKTRONIX INC·Filed 2020·Granted Sep 27, 2022·0 cites·10 claims
- 1074US10330705B2Calibration for test and measurement instrument including asynchronous time-interleaved digitizer using harmonic mixingTEKTRONIX INC·Filed 2016·Granted Jun 25, 2019·2 cites·10 claims
- 1174US7408406B2Mode selection amplifier circuit usable in a signal acquisition probeTEKTRONIX INC·Filed 2006·Granted Aug 5, 2008·8 cites·28 claims
- 1269US10502763B2Noise reduction in digitizing systemsTEKTRONIX INC·Filed 2016·Granted Dec 10, 2019·1 cites·20 claims
- 1366US11372025B2Systems and methods for synchronizing multiple test and measurement instrumentsTEKTRONIX INC·Filed 2021·Granted Jun 28, 2022·0 cites·20 claims
- 1466US11249111B2Automatic probe ground connection checking techniquesTEKTRONIX INC·Filed 2018·Granted Feb 15, 2022·0 cites·8 claims
- 1564US7868664B2Generating a trigger from a differential signalTEKTRONIX INC·Filed 2009·Granted Jan 11, 2011·6 cites·4 claims
- 1663US6563365B2Low-noise four-quadrant multiplier method and apparatusTEKTRONIX INC·Filed 2001·Granted May 13, 2003·8 cites·17 claims
- 1762US9568503B2Calibration for test and measurement instrument including asynchronous time-interleaved digitizer using harmonic mixingTEKTRONIX INC·Filed 2015·Granted Feb 14, 2017·1 cites·20 claims
- 1862US2025277820A1Compressed sensing in oscilloscopes for higher bandwidthTEKTRONIX INC·Filed 2025·Application pending·0 cites
- 1960US12228611B2Signal path calibration of a hardware setting in a test and measurement instrumentTEKTRONIX INC·Filed 2020·Granted Feb 18, 2025·0 cites·19 claims
- 2058US11619657B2Frequency converter accessory for a test and measurement instrumentTEKTRONIX INC·Filed 2020·Granted Apr 4, 2023·0 cites·27 claims
- 2155US11041884B2Calibration for test and measurement instrument including asynchronous time-interleaved digitizer using harmonic mixingTEKTRONIX INC·Filed 2019·Granted Jun 22, 2021·0 cites·20 claims
- 2250US2023221352A1Automatic determination of spectrum and spectrogram attributes in a test and measurement instrumentTEKTRONIX INC·Filed 2022·Application pending·0 cites
- 2345US2015084660A1Time-domain reflectometer de-embed probeTEKTRONIX INC·Filed 2014·Application pending·0 cites
- 2443US6804306B2Stable in-phase/quadrature (I/Q) generator method and apparatusTEKTRONIX INC·Filed 2001·Granted Oct 12, 2004·0 cites·13 claims
- 2539US2007105516A1Automatic compensation of gain versus temperatureHICKMAN BARTON T·Filed 2005·Application pending·0 cites
- 2638US12395176B2Multiple sample-rate data converterTEKTRONIX INC·Filed 2022·Granted Aug 19, 2025·0 cites·26 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →