Inventor · disambiguated record
Babak H. Khalaj
Also filed as: KHALAJ BABAK H
2 granted patents·1 pending application·172 citations·filing 1994–2003
71Inventor score
Top patents by PatentIndex Score
3 records- 0192US5513275AAutomated direct patterned wafer inspectionUNIV LELAND STANFORD JUNIOR·Filed 1994·Granted Apr 30, 1996·101 cites·4 claims
- 0288US6668041B2Single ended line probing in DSL systemCENTILLIUM COMMUNICATIONS INC·Filed 2001·Granted Dec 23, 2003·71 cites·22 claims
- 0347US2004062361A1Single ended line probing in DSL systemFiled 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →