Inventor · disambiguated record
Baek Young Lee
Also filed as: LEE BAEK YOUNG
2 granted patents·4 citations·filing 2020–2023
44Inventor score
Technology areasG06N
Files withSAMSUNG SDS CO LTD2
Top patents by PatentIndex Score
2 records- 0188US11587222B2Method and apparatus for detecting defect pattern on wafer based on unsupervised learningSAMSUNG SDS CO LTD·Filed 2020·Granted Feb 21, 2023·4 cites·5 claims
- 0266US11816579B2Method and apparatus for detecting defect pattern on wafer based on unsupervised learningSAMSUNG SDS CO LTD·Filed 2023·Granted Nov 14, 2023·0 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →