Inventor · disambiguated record
Baimao Lei
Also filed as: LEI BAIMAO
1 granted patent·1 pending application·0 citations·filing 2025–2025
1Inventor score
Files withCHINA ELECTRONIC PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST 5TH ELECTRONIC RES1CHINA ELECTRONIC PRODUCT RELIABILITY AND ENVIRONMENTAL TESTING RESEARCH INSTITUTE THE FIFTH ELECTRON1
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2 records- 0156US12493070B2Parallel accelerated test method and apparatus that separately applies multiple sensitive stresses to multiple componentsCHINA ELECTRONIC PRODUCT RELIABILITY AND ENVIRONMENTAL TESTING RESEARCH INSTITUTE THE FIFTH ELECTRON·Filed 2025·Granted Dec 9, 2025·0 cites·10 claims
- 0248US2025290830A1Integrated Product Testing Method and Device Combining Accelerated Life Test and Accelerated Degradation TestCHINA ELECTRONIC PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST 5TH ELECTRONIC RES·Filed 2025·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →