Inventor · disambiguated record
Benjamin Brosilow
Also filed as: BROSILOW BENJAMIN · BROSILOW BENJAMIN J
4 granted patents·2 pending applications·94 citations·filing 1998–2021
76Inventor score
Files withASSOCIATES ISRAEL LTD AG2CI SYSTEMS ISRAEL LTD1CI SYSTEMS LTD1STEAG C V D SYSTEMS LTD1STEAG CVD SYSTEMS LTD1
Top patents by PatentIndex Score
6 records- 0178US6191011B1Selective hemispherical grain silicon depositionASSOCIATES ISRAEL LTD AG·Filed 1998·Granted Feb 20, 2001·63 cites·54 claims
- 0257US6204120B1Semiconductor wafer pretreatment utilizing ultraviolet activated chlorineASSOCIATES ISRAEL LTD AG·Filed 1998·Granted Mar 20, 2001·19 cites·30 claims
- 0345US2024014052A1Synchronization between temperature measurement device and radiation sourcesCI SYSTEMS ISRAEL LTD·Filed 2021·Application pending·0 cites
- 0444US6395192B1Method and apparatus for removing native oxide layers from silicon wafersSTEAG C V D SYSTEMS LTD·Filed 1999·Granted May 28, 2002·12 cites·10 claims
- 0538US7742171B2Reflectivity/emissivity measurement probe insensitive to variations in probe-to-target distanceCI SYSTEMS LTD·Filed 2007·Granted Jun 22, 2010·0 cites·25 claims
- 0632US2002108930A1Apparatus for removing native oxide layers from silicon wafersSTEAG CVD SYSTEMS LTD·Filed 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →