Inventor · disambiguated record
Benoit Froment
Also filed as: FROMENT BENOIT · FROMENT BENOîT
22 granted patents·7 pending applications·60 citations·filing 1999–2025
91Inventor score
Files withST MICROELECTRONICS CROLLES 2 SAS11ST MICROELECTRONICS SA5ST MICROELECTRONICS CROLLES 24KONINKL PHILIPS ELECTRONICS NV2FREESCALE SEMICONDUCTOR INC1
Top patents by PatentIndex Score
29 records- 0190US10833027B2Integrated physically unclonable function device with a set of transistors exhibiting a random distribution of threshold voltagesST MICROELECTRONICS CROLLES 2 SAS·Filed 2017·Granted Nov 10, 2020·6 cites·24 claims
- 0281US7638427B2MOS transistor with fully silicided gateST MICROELECTRONICS CROLLES 2·Filed 2006·Granted Dec 29, 2009·13 cites·32 claims
- 0371US6366098B1Test structure, integrated circuit, and test methodST MICROELECTRONICS SA·Filed 1999·Granted Apr 2, 2002·33 cites·9 claims
- 0470US2025275172A1Semiconductor integrated circuit componentST MICROELECTRONICS CROLLES 2 SAS·Filed 2025·Application pending·0 cites
- 0566US12087708B2Chip protected against back-face attacksST MICROELECTRONICS CROLLES 2 SAS·Filed 2021·Granted Sep 10, 2024·0 cites·20 claims
- 0665US12063775B2Read only memoryST MICROELECTRONICS ROUSSET·Filed 2023·Granted Aug 13, 2024·0 cites·20 claims
- 0763US12328896B2Semiconductor integrated circuit componentST MICROELECTRONICS CROLLES 2 SAS·Filed 2021·Granted Jun 10, 2025·0 cites·27 claims
- 0860US11818883B2Read only memoryST MICROELECTRONICS CROLLES 2 SAS·Filed 2021·Granted Nov 14, 2023·0 cites·20 claims
- 0956US10770357B2Integrated circuit with improved resistive regionST MICROELECTRONICS CROLLES 2 SAS·Filed 2019·Granted Sep 8, 2020·0 cites·25 claims
- 1052US10354926B2Integrated circuit with improved resistive regionST MICROELECTRONICS CROLLES 2 SAS·Filed 2017·Granted Jul 16, 2019·0 cites·27 claims
- 1150US12052376B2Integrated physical unclonable function deviceST MICROELECTRONICS CROLLES 2 SAS·Filed 2021·Granted Jul 30, 2024·0 cites·16 claims
- 1250US11183468B2Chip protected against back-face attacksST MICROELECTRONICS CROLLES 2 SAS·Filed 2017·Granted Nov 23, 2021·0 cites·16 claims
- 1350US10497653B2Decoupling capacitorST MICROELECTRONICS CROLLES 2 SAS·Filed 2017·Granted Dec 3, 2019·0 cites·19 claims
- 1449US2021399094A1Electronic security componentST MICROELECTRONICS CROLLES 2 SAS·Filed 2021·Application pending·0 cites
- 1544US8354725B2MIM transistorST MICROELECTRONICS CROLLES 2·Filed 2011·Granted Jan 15, 2013·0 cites·16 claims
- 1642US8295028B2Increasing the capacitance of a capacitive device by micromaskingFROMENT BENOIT·Filed 2008·Granted Oct 23, 2012·0 cites·19 claims
- 1742US2008135827A1MIM transistorST MICROELECTRONICS CROLLES 2·Filed 2007·Application pending·0 cites
- 1841US7018865B2Method of protecting an element of an integrated circuit against the formation of a metal silicideST MICROELECTRONICS SA·Filed 2004·Granted Mar 28, 2006·2 cites·21 claims
- 1940US10754618B2Random number generatorSTMICROELECTRONICS ROUSSET·Filed 2018·Granted Aug 25, 2020·0 cites·23 claims
- 2040US7781296B2Integrated circuit comprising a capacitor with metal electrodes and process for fabricating such a capacitorSTMICROELECTRONICS SAS·Filed 2005·Granted Aug 24, 2010·0 cites·14 claims
- 2140US7622387B2Gate electrode silicidation processFREESCALE SEMICONDUCTOR INC·Filed 2005·Granted Nov 24, 2009·0 cites·9 claims
- 2240US6504380B2Device and method for checking integrated capacitorsST MICROELECTRONICS SA·Filed 2001·Granted Jan 7, 2003·2 cites·27 claims
- 2339US8975682B2Integrated circuit comprising a capacitor with HSG metal electrodesHALIMAOUI AOMAR·Filed 2010·Granted Mar 10, 2015·0 cites·7 claims
- 2439US2004149808A1Method for the adhesion of two elements, in particular of an integrated circuit, for example an encapsulation of a resonator, and corresponding integrated circuitST MICROELECTRONICS SA·Filed 2003·Application pending·0 cites
- 2538US7947583B2Forming of silicide areas in a semiconductor deviceST MICROELECTRONICS SA·Filed 2006·Granted May 24, 2011·0 cites·22 claims
- 2638US6627093B1Method of manufacturing a vertical metal connection in an integrated circuitKONINKL PHILIPS ELECTRONICS NV·Filed 2000·Granted Sep 30, 2003·4 cites·4 claims
- 2737US2011095381A1Gate structure and method for making sameMUELLER MARKUS·Filed 2005·Application pending·0 cites
- 2833US2007034948A1Silicidation process for an nmos transistor and corresponding integrated circuitST MICROELECTRONICS CROLLES 2·Filed 2006·Application pending·0 cites
- 2930US2005208765A1Method for the formation of silicidesKONINKL PHILIPS ELECTRONICS NV·Filed 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →