Inventor · disambiguated record
Ben Han
Also filed as: Han ben
2 granted patents·3 citations·filing 2021–2022
42Inventor score
Technology areasG01R
Files withINVENTEC PUDONG TECH CORP2
Top patents by PatentIndex Score
2 records- 0184US11435400B1Test coverage rate improvement system for pins of tested circuit board and method thereofINVENTEC PUDONG TECH CORP·Filed 2021·Granted Sep 6, 2022·2 cites·8 claims
- 0282US12025660B2System of performing boundary scan test on pin through test point and method thereofINVENTEC PUDONG TECH CORP·Filed 2022·Granted Jul 2, 2024·1 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →