Inventor · disambiguated record
Benjamin Jacobs
Also filed as: JACOBS BENJAMIN · JACOBS BENJAMIN CAPE
9 granted patents·4 pending applications·6 citations·filing 2020–2025
81Inventor score
Top patents by PatentIndex Score
13 records- 0193US11902665B2Automated application of drift correction to sample studied under electron microscopePROTOCHIPS INC·Filed 2022·Granted Feb 13, 2024·4 cites·20 claims
- 0289US10986279B1Automated application of drift correction to sample studied under electron microscopePROTOCHIPS INC·Filed 2020·Granted Apr 20, 2021·2 cites·12 claims
- 0387US2025338020A1Automated application of drift correction to sample studied under electron microscopePROTOCHIPS INC·Filed 2025·Application pending·0 cites
- 0484US12375815B2Automated application of drift correction to sample studied under electron microscopePROTOCHIPS INC·Filed 2024·Granted Jul 29, 2025·0 cites·20 claims
- 0584US12284445B2Automated application of drift correction to sample studied under electron microscopePROTOCHIPS INC·Filed 2024·Granted Apr 22, 2025·0 cites·20 claims
- 0680US2025260901A1Automated application of drift correction to sample studied under electron microscopePROTOCHIPS INC·Filed 2025·Application pending·0 cites
- 0777US12010430B2Automated application of drift correction to sample studied under electron microscopePROTOCHIPS INC·Filed 2022·Granted Jun 11, 2024·0 cites·20 claims
- 0874US2025046797A1Coated Single Crystalline Metal Oxide Materials and Method for Producing The SameACTION BATTERY TECH L L C·Filed 2024·Application pending·0 cites
- 0972US11477388B2Automated application of drift correction to sample studied under electron microscopePROTOCHIPS INC·Filed 2021·Granted Oct 18, 2022·0 cites·20 claims
- 1071US12341190B2Coated single crystalline metal oxide materials and method for producing the sameACTION BATTERY TECH INC·Filed 2023·Granted Jun 24, 2025·0 cites·20 claims
- 1170US2025273660A1Coated Single Crystalline Metal Oxide Materials and Method for Producing the SameACTION BATTERY TECH INC·Filed 2025·Application pending·0 cites
- 1269US11514586B1Automated application of drift correction to sample studied under electron microscopePROTOCHIPS INC·Filed 2022·Granted Nov 29, 2022·0 cites·25 claims
- 1369US11399138B2Automated application of drift correction to sample studied under electron microscopePROTOCHIPS INC·Filed 2021·Granted Jul 26, 2022·0 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →