Inventor · disambiguated record
Beau A. Marth
Also filed as: MARTH BEAU · MARTH BEAU A
13 granted patents·7 pending applications·22 citations·filing 2018–2025
88Inventor score
Files withELEMENTAL SCIENTIFIC INC20
Top patents by PatentIndex Score
20 records- 0195US11049741B2Systems for integrated decomposition and scanning of a semiconducting waferELEMENTAL SCIENTIFIC INC·Filed 2018·Granted Jun 29, 2021·8 cites·13 claims
- 0294US11244841B2Systems for integrated decomposition and scanning of a semiconducting waferELEMENTAL SCIENTIFIC INC·Filed 2018·Granted Feb 8, 2022·8 cites·20 claims
- 0391US11804390B2Systems for integrated decomposition and scanning of a semiconducting waferELEMENTAL SCIENTIFIC INC·Filed 2021·Granted Oct 31, 2023·1 cites·20 claims
- 0489US11476134B2Systems for integrated decomposition and scanning of a semiconducting waferELEMENTAL SCIENTIFIC INC·Filed 2021·Granted Oct 18, 2022·1 cites·7 claims
- 0585US12094738B2Systems for integrated decomposition and scanning of a semiconducting waferELEMENTAL SCIENTIFIC INC·Filed 2023·Granted Sep 17, 2024·0 cites·20 claims
- 0685US11441978B1Automatic evaporative sample preparationELEMENTAL SCIENTIFIC INC·Filed 2019·Granted Sep 13, 2022·3 cites·19 claims
- 0783US11694914B2Systems for integrated decomposition and scanning of a semiconducting waferELEMENTAL SCIENTIFIC INC·Filed 2022·Granted Jul 4, 2023·0 cites·20 claims
- 0883US2024006201A1Systems for integrated decomposition and scanning of a semiconducting waferELEMENTAL SCIENTIFIC INC·Filed 2023·Application pending·0 cites
- 0980US11705351B2Systems for integrated decomposition and scanning of a semiconducting waferELEMENTAL SCIENTIFIC INC·Filed 2018·Granted Jul 18, 2023·1 cites·17 claims
- 1076US2025079198A1Systems and methods for recovering organic contaminants from semiconducting wafersELEMENTAL SCIENTIFIC INC·Filed 2024·Application pending·0 cites
- 1176US2025079145A1Systems and methods for recovering organic contaminants from semiconducting wafersELEMENTAL SCIENTIFIC INC·Filed 2024·Application pending·0 cites
- 1276US2025076160A1Systems and methods for recovering organic contaminants from semiconducting wafersELEMENTAL SCIENTIFIC INC·Filed 2024·Application pending·0 cites
- 1375US2025327828A1Autosampler system with automated sample container cover removal and sample probe positioningELEMENTAL SCIENTIFIC INC·Filed 2025·Application pending·0 cites
- 1474US2025189412A1Systems for integrated decomposition and scanning of a semiconducting waferELEMENTAL SCIENTIFIC INC·Filed 2024·Application pending·0 cites
- 1573US11761970B2Autosampler rail system with magnetic coupling for linear motionELEMENTAL SCIENTIFIC INC·Filed 2021·Granted Sep 19, 2023·0 cites·19 claims
- 1671US12320821B2Autosampler system with automated sample container cover removal and sample probe positioningELEMENTAL SCIENTIFIC INC·Filed 2021·Granted Jun 3, 2025·0 cites·19 claims
- 1771US2025299941A1Shaped-channel scanning nozzle for scanning of a material surfaceELEMENTAL SCIENTIFIC INC·Filed 2025·Application pending·0 cites
- 1864US12300480B2Shaped-channel scanning nozzle for scanning of a material surfaceELEMENTAL SCIENTIFIC INC·Filed 2022·Granted May 13, 2025·0 cites·4 claims
- 1962US12152966B2Systems for integrated decomposition and scanning of a semiconducting waferELEMENTAL SCIENTIFIC INC·Filed 2021·Granted Nov 26, 2024·0 cites·7 claims
- 2056US12444654B2Systems and methods for determining flow characteristics of a fluid segment for analytic determinationsELEMENTAL SCIENTIFIC INC·Filed 2022·Granted Oct 14, 2025·0 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →